Browsing by Author "Fleetwood, D.M."
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Publication Advanced transistors for high frequency applications
Proceedings paper2020, 237th ECS Spring Meeting - Advanced CMOS-compatible Semiconductor Devices 19, 10/05/2020, p.27-38Publication Heavy ion and laser induced charge collection in SiGe bulk PMOSFETs
;Zhang, E.X. ;Samsel, I.K. ;Hooten, N.C. ;Bennett, W.G. ;Funkhouser, E.D. ;Kai, N.Ball, D.R.Proceedings paper2014, IEEE Nuclear & Space Radiation Effects Conference - NSREC, 14/07/2014, p.PE-4Publication Heavy ion and laser-induced transients in SiGe channel pMOSFETs
;Zhang, E.X. ;Samsel, I.K. ;Bennett, W.G. ;Hooten, N.C. ;McCurdy, M. ;Fleetwood, D.M.Reed, R.A.Proceedings paper2013, International Semiconductors Device Research Symposium, 11/12/2013, p.FA7-03Publication Heavy-ion-induced current transients in bulk and SOI FinFETs
;El-Mamouni, F. ;Zhang, X. ;Ball, D.R. ;Sierawski, B. ;King, M.P. ;Schrimpf, R.D.Reed, R.A.Journal article2012, IEEE Transactions on Nuclear Science, (59) 6, p.2674-2681Publication Impact of back-gate bias and fevice geometry on the total ionizing dose response of 1-transistor floating body RAMs
Journal article2012, IEEE Transactions on Nuclear Science, (59) 6, p.2966-2973Publication Negative bias temperature instabilities in SiGe-pMOSFETs with SiO2/HfO2 gate dielectrics
Meeting abstract2013, 44th IEEE Semcionductor Interface Specialists Conference - SISC, 5/12/2013Publication Total ionizing dose effects on Ge channel pFETs with raised Si0.55Ge0.45 source drain
;Wang, L. ;Zhang, E.X. ;Zhang, C.X. ;Duan, G.X. ;Schrimpf, R.D. ;Fleetwood, D.M.Reed, R.A.Proceedings paper2015, IEEE Nuclear & Space Radiation Effects Conference - NSREC, 13/07/2015, p.22-25Publication Total-ionizing-dose effects on ultrathin-body-and-buried- oxide MOSFETs
Oral presentation2012, IEEE Nuclear and Space Radiation Effects Conference - NSRECPublication Total-ionizing-dose response of hghly-scaled gate-all-around Si nanowire CMOS transistors
;Gorchichko, Maria ;Zhang, E.X. ;Wang, P. ;Schrimpf, R. ;Reed, R. ;Fleetwood, D.M.Bonaldo, S.Proceedings paper2020, Nuclear & Space Radiation Effects Conference - NSREC, 20/07/2020, p.C-4