Repository logo Institutional repository
  • Communities & Collections
  • Browse
  • Site
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "Fleetwood, D.M."

Filter results by typing the first few letters
Now showing 1 - 9 of 9
  • Results Per Page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    Advanced transistors for high frequency applications

    Parvais, Bertrand  
    ;
    Peralagu, Uthayasankaran  
    ;
    Alian, AliReza  
    ;
    Vais, Abhitosh  
    Proceedings paper
    2020, 237th ECS Spring Meeting - Advanced CMOS-compatible Semiconductor Devices 19, 10/05/2020, p.27-38
  • Loading...
    Thumbnail Image
    Publication

    Heavy ion and laser induced charge collection in SiGe bulk PMOSFETs

    Zhang, E.X.
    ;
    Samsel, I.K.
    ;
    Hooten, N.C.
    ;
    Bennett, W.G.
    ;
    Funkhouser, E.D.
    ;
    Kai, N.
    ;
    Ball, D.R.
    Proceedings paper
    2014, IEEE Nuclear & Space Radiation Effects Conference - NSREC, 14/07/2014, p.PE-4
  • Loading...
    Thumbnail Image
    Publication

    Heavy ion and laser-induced transients in SiGe channel pMOSFETs

    Zhang, E.X.
    ;
    Samsel, I.K.
    ;
    Bennett, W.G.
    ;
    Hooten, N.C.
    ;
    McCurdy, M.
    ;
    Fleetwood, D.M.
    ;
    Reed, R.A.
    Proceedings paper
    2013, International Semiconductors Device Research Symposium, 11/12/2013, p.FA7-03
  • Loading...
    Thumbnail Image
    Publication

    Heavy-ion-induced current transients in bulk and SOI FinFETs

    El-Mamouni, F.
    ;
    Zhang, X.
    ;
    Ball, D.R.
    ;
    Sierawski, B.
    ;
    King, M.P.
    ;
    Schrimpf, R.D.
    ;
    Reed, R.A.
    Journal article
    2012, IEEE Transactions on Nuclear Science, (59) 6, p.2674-2681
  • Loading...
    Thumbnail Image
    Publication

    Impact of back-gate bias and fevice geometry on the total ionizing dose response of 1-transistor floating body RAMs

    Mahatme, N.
    ;
    Zhang, E.
    ;
    Reed, R.A.
    ;
    Bhuva, B.L.
    ;
    Schrimpf, R.D.
    ;
    Fleetwood, D.M.
    ;
    Linten, Dimitri  
    Journal article
    2012, IEEE Transactions on Nuclear Science, (59) 6, p.2966-2973
  • Loading...
    Thumbnail Image
    Publication

    Negative bias temperature instabilities in SiGe-pMOSFETs with SiO2/HfO2 gate dielectrics

    Duan, G.X
    ;
    Zhang, C. X.
    ;
    Zhang, E.X.
    ;
    Fleetwood, D.M.
    ;
    Schrimpf, R.D
    ;
    Reed, R. A.
    ;
    Linten, Dimitri  
    Meeting abstract
    2013, 44th IEEE Semcionductor Interface Specialists Conference - SISC, 5/12/2013
  • Loading...
    Thumbnail Image
    Publication

    Total ionizing dose effects on Ge channel pFETs with raised Si0.55Ge0.45 source drain

    Wang, L.
    ;
    Zhang, E.X.
    ;
    Zhang, C.X.
    ;
    Duan, G.X.
    ;
    Schrimpf, R.D.
    ;
    Fleetwood, D.M.
    ;
    Reed, R.A.
    Proceedings paper
    2015, IEEE Nuclear & Space Radiation Effects Conference - NSREC, 13/07/2015, p.22-25
  • Loading...
    Thumbnail Image
    Publication

    Total-ionizing-dose effects on ultrathin-body-and-buried- oxide MOSFETs

    Mahatme, Nihaar
    ;
    Zhang, E.X.
    ;
    Linten, Dimitri  
    ;
    Griffoni, A.
    ;
    Aoulaiche, Marc
    ;
    Simoen, Eddy  
    Oral presentation
    2012, IEEE Nuclear and Space Radiation Effects Conference - NSREC
  • Loading...
    Thumbnail Image
    Publication

    Total-ionizing-dose response of hghly-scaled gate-all-around Si nanowire CMOS transistors

    Gorchichko, Maria
    ;
    Zhang, E.X.
    ;
    Wang, P.
    ;
    Schrimpf, R.
    ;
    Reed, R.
    ;
    Fleetwood, D.M.
    ;
    Bonaldo, S.
    Proceedings paper
    2020, Nuclear & Space Radiation Effects Conference - NSREC, 20/07/2020, p.C-4

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings