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Browsing by Author "Forester, Lynn"

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    Characterization and process integration of a low-k spin-on dielectric

    Ballantyne, Catherine
    ;
    Forester, Lynn
    ;
    Waeterloos, Joost
    Oral presentation
    1996, International Conference on Metallurgical Coatings and Thin Films; April 22-26, 1996; San Diego, Calif., USA.
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    Development of a global planarization process without CMP

    Forester, Lynn
    ;
    Coenegrachts, Bart  
    ;
    Stone, M.
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    Meynen, Herman
    ;
    Grillaert, Joost
    ;
    Van den hove, Luc  
    Proceedings paper
    1994, 11th VLSI Multilevel Interconnect Conference - VMIC, 07/06/1994, p.172-178
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    Development of a non-destructive thin film porosimetry: pore size distribution and pore volume of porous silica

    Baklanov, Mikhaïl
    ;
    Dultsev, F. N.
    ;
    Kondoh, Eiichi
    ;
    Mogilnikov, K. P.
    ;
    Maex, Karen  
    ;
    Wang, Sharon
    Proceedings paper
    1999, Advanced Metallization Conference in 1998. Proceedings of the Conference;, p.507-512
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    Etch process development for FLARE(tm) for dual damascene architecture using a N2/O2 plasma

    Thompson, Heike
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    Vanhaelemeersch, Serge  
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    Maex, Karen  
    ;
    Van Ammel, Annemie  
    ;
    Beyer, Gerald  
    Proceedings paper
    1999, Proceedings of the International Interconnect Technology Conference - IITC; San Francisco, CA, USA., p.59-61
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    Improved hot-carrier reliability in a 0.5-µm TLM CMOS process by back-end process optimization

    Van den Bosch, Geert  
    ;
    Deferm, Ludo  
    ;
    Forester, Lynn
    ;
    Collins, Tom
    Proceedings paper
    1994, 24th European Solid State Device Research Conference - ESSDERC, 11/09/1994, p.303-306
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    Integration of non-etchback low-k methy silsequioxane polymer using electron beam cure

    Gao, Teng
    ;
    Coenegrachts, Bart  
    ;
    Waeterloos, Joost
    ;
    Van Hove, Marleen
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    Maex, Karen  
    ;
    Yang, Jiping
    Proceedings paper
    1999, Advanced Metallization Conference in 1998 - AMC 1998, 6/10/1998, p.491-497
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    Interlevel dielectric engineering for improved device performance in half-micron CMOS

    Forester, Lynn
    ;
    Collins, Tom
    ;
    Van den Bosch, Geert  
    ;
    Meynen, Herman
    ;
    Coenegrachts, Bart  
    Proceedings paper
    1994, 11th VLSI Multilevel Interconnect Conference - VMIC, 07/06/1994, p.111-113

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