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Browsing by Author "Froyen, L."

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    A new approach for the measurement of resistivity and cross-sectional area of an aluminium interconnect line: principle and applications

    Li, Hua
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    Jin, S.
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    Proost, Joris
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    Van Hove, Marleen
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    Froyen, L.
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    Maex, Karen  
    Proceedings paper
    1998, Advanced Metallization and Interconnect Systems for ULSI Applications in 1997, 30/09/1997, p.197-204
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    Analyses of post metal etch cleaning in downstream H2O-based plasma followed by a wet chemistry

    Li, H.
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    Baklanov, Mikhaïl
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    Boullart, Werner  
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    Conard, Thierry  
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    Brijs, Bert
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    Maex, Karen  
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    Froyen, L.
    Journal article
    1999, J. Electrochem. Soc., (146) 10, p.3843-3851
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    Characterization and barrier properties for Cu metallization of tungsten nitride deposited by PECVD using WF6 +N2 +H2

    Li, Hua
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    Heyvaert, Ilse  
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    Sing, Jin
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    Lanckmans, Filip
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    Brijs, Bert
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    Bender, Hugo  
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    Maex, Karen  
    Proceedings paper
    1999, Advanced Metallization Conference in 1998 - AMC 1998, 6/10/1998, p.297-303
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    Characterization and barrier properties for Cu metallization of tungsten nitride deposited by PECVD using WF6+N2+H2

    Li, H.
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    Heyvaert, Ilse  
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    Jin, S.
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    Lanckmans, Filip
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    Bender, Hugo  
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    Maex, Karen  
    ;
    Froyen, L.
    Oral presentation
    1998, Advanced Metallization Conference; October 1998;
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    Characterization of WF6/N2/H2 plasma enhanced chemical vapor deposited WxN films as barriers for Cu metallization

    Li, Hua
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    Jin, S.
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    Bender, Hugo  
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    Lanckmans, Filip
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    Heyvaert, Ilse  
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    Maex, Karen  
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    Froyen, L.
    Journal article
    2000, J. Vacuum Science and Technology B, (B18) 1, p.242-251
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    Comparison of the electromigration behavior of Al(MgCu) with Al(Cu) and Al(SiCu)

    Li, Hua
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    Witvrouw, Ann
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    Jin, S.
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    Bender, Hugo  
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    Maex, Karen  
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    Froyen, L.
    Proceedings paper
    1998, Advanced Interconnects and Contact Materials and Processes for Future Integrated Circuits, 13/04/1998, p.133-138
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    Evaluation of post metal etch cleaning by analyzing chemical compositions and distributions

    Li, H.
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    Baklanov, Mikhaïl
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    Boullart, Werner  
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    Conard, Thierry  
    ;
    Brijs, Bert
    ;
    Maex, Karen  
    ;
    Froyen, L.
    Oral presentation
    1998, 4th International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS
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    Evaluation of post metal etch cleaning by analyzing chemical compositions and distributions

    Li, H.
    ;
    Baklanov, Mikhaïl
    ;
    Boullart, Werner  
    ;
    Conard, Thierry  
    ;
    Brijs, Bert
    ;
    Maex, Karen  
    ;
    Froyen, L.
    Proceedings paper
    1999, Ultra Clean Processing of Silicon Surfaces; Proceedings of the 4th International Symposium on Ultra Clean Processing of Silicon, 21/09/1998, p.177-180
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    Gaseous impurities in Co silicidation - impact and solutions

    Li, Hua
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    Vereecke, Guy  
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    Maex, Karen  
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    Froyen, L.
    Journal article
    2001, Journal of the Electrochemical Society, (148) 6, p.G344-G354
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    Interaction of Ti capped Co thin film with Si3N4

    Li, Hua
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    Bender, Hugo  
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    Conard, Thierry  
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    Maex, Karen  
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    Gutakovskii, A.
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    Van Landuyt, J.
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    Froyen, L.
    Journal article
    2000, Applied Physics Letters, (77) 26, p.4307-9
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    Segregation of Cu on etched and non-etched Al(Cu) surface

    Li, Hua
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    Maex, Karen  
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    Brijs, Bert
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    Conard, Thierry  
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    Vandervorst, Wilfried  
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    Baklanov, Mikhaïl
    Proceedings paper
    1998, Materials Reliability in Microelectronics VIII, 13/04/1998, p.77-82
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    Synthesis and mechanical and tribological characterization of alumina-yttria stabilized zirconia (YSZ) nanocomposites with YSZ synthesized by means of an aqueous solution-gel method or a hydrothermal route

    Geuzens, E.
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    Mullens, S.
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    Cooymans, J.
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    Luyten, J.
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    Lemoisson, F.
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    Sastry, K.Y.
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    Froyen, L.
    Journal article
    2008, Ceramics International, (34) 5, p.1315-1325
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    Thermal desorption issues related to silicidation and back-end metallization

    Li, H.
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    Vereecke, Guy  
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    Schaekers, Marc  
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    Baklanov, Mikhaïl
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    Sleeckx, Erik  
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    Maex, Karen  
    ;
    Froyen, L.
    Oral presentation
    1999, Advanced Metallization Conference; 28-30 September 1999; Orlando, FL, USA.
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    Thermal desorption issues related to silicidation and back-end metallization

    Li, Hua
    ;
    Vereecke, Guy  
    ;
    Schaekers, Marc  
    ;
    Baklanov, Mikhaïl
    ;
    Sleeckx, Erik  
    ;
    Maex, Karen  
    ;
    Froyen, L.
    Proceedings paper
    2000, Advanced Metallization Conference 1999 - AMC 1999, 28/09/1999, p.577-581

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