Browsing by Author "Ganguly, Udayan"
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Publication Experimental Validation of Process-Induced Variability Aware SPICE Simulation Platform for Sub-20 nm FinFET Technologies
Journal article2021, IEEE TRANSACTIONS ON ELECTRON DEVICES, (68) 3, p.976-980Publication Impact of top-surface tunnel-oxide nitridation on flash memory performance and reliability
Journal article2010, IEEE Electron Device Letters, (31) 2, p.123-125Publication Investigation of Dielectric and Quantum Confinement Based Dopant Deactivation in the Extension Region of FinFET
Journal article2022, IEEE ELECTRON DEVICE LETTERS, (43) 8, p.1171-1174Publication Nitride engineering for improved erase performance and retention of TANOS NAND Flash memory
Proceedings paper2008-05, Joint Non-volatile Semiconductor Memory Workshop / International Conference on Memory Technology and Design, 18/05/2008, p.128-129Publication O2 post deposition anneal of Al2O3 blocking dielectric for higher performance and reliability of TANOS flash memory
Proceedings paper2009, 39th European Solid-State Device Research Conference - ESSDERC, 14/09/2009, p.272-275