Browsing by Author "Gerardin, Simone"
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Publication Angular and strain dependence of heavy-ions induced degration in SOI FinFETs
;Griffoni, Alessio ;Gerardin, Simone ;Meneghesso, GaudenzioPaccagnella, AlessandroJournal article2010, IEEE Transactions on Nuclear Science, (57) 4, p.1924-1932Publication Dose enhancement due to interconnects in deep-submicron MOSFETs exposed to X-rays
;Griffoni, Alessio ;Silvestri, Marco ;Gerardin, SimoneMeneghesso, GaudenzioProceedings paper2008, 8th European Workshop on Radiation Effects on Components and Systems - RADECS, 10/09/2008, p.432-437Publication Dose enhancement due to interconnects in deep-submicron MOSFETs exposed to X-rays
;Griffoni, Alessio ;Silvestri, Marco ;Gerardin, SimoneMeneghesso, GaudenzioJournal article2009, IEEE Transactions on Nuclear Science, (56) 4, part 2, p.2205-2212Publication TID Effects in Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors Irradiated to Ultrahigh Doses
;Bonaldo, Stefano ;Gorchichko, Mariia ;Zhang, En Xia ;Ma, Teng ;Mattiazzo, SerenaBagatin, MartaJournal article2022, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (69) 7, p.1444-1452Publication Total-ionizing-dose effects in InGaAs MOSFETs with high-k gate dielectrics and InP substrates
Journal article2020, IEEE Transactions on Nuclear Science, (67) 7, p.1312-1319Publication Total-ionizing-dose effects on InGaAs FinFETs with improved gate stack
Proceedings paper2019, Radiation Effects on Devices & ICs 2019 - RADECS, 16/09/2019Publication Total-ionizing-dose effects on InGaAs FinFETs with modified gate stack
Journal article2020-01, IEEE Transactions on Nuclear Science, (67) 1, p.253-259