Browsing by Author "Gerrer, Louis"
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Publication Experimental evidences and simulations of trap generation along the percolation path
Proceedings paper2015, 45th European Solid State Device Research Conference - ESSDERC, 14/09/2015, p.226-229Publication Insight into electron traps and their energy distribution under positive bias temperature stress and hot carrier aging
Publication Interplay between statistical variability and reliability in contemporary p-MOSFETs: measurements vs. simulated
Journal article2014, IEEE Transactions on Electron Devices, (61) 9, p.3265-3273Publication Reliability aware simulation flow: from TCAD calibration to circuit level analysis
Proceedings paper2015, International Conference on Simulation of Semiconductor Processes and Devices - SISPAD, 9/09/2015, p.152-155Publication Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow
Publication TCAD-based methodology for reliability assessment of nanoscaled MOSFETs
Proceedings paper2015, 11th Conference on Ph.D. Research in Microelectronics and Electronics - PRIME, 29/06/2015, p.270-273