Browsing by Author "Ghica, C."
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Publication Imaging of H2 bubbles and the related strain field in silicon wafers exposed to RF hydrogen plasma
Proceedings paper2004, Proceedings of the 13th European Microscopy Congress. Volume 2: Materials Sciences, 22/08/2004, p.395-396Publication In situ transmission electron microscopy study of the silicidation process in Co thin films on patterned (001) Si substrates
Journal article2001, Journal of Materials Research, (16) 3, p.701-708Publication Quantitative description of the strain field around {111} planar defects in hydrogenated silicon wafers
Proceedings paper2004, Proceedings of the 13th European Microscopy Congress. Volume 2: Materials Sciences, 22/08/2004, p.405-406Publication TEM characterization of extended defects induced in Si wafers by H-plasma treatment
Journal article2007-01, Journal of Physics D: Applied Physics, 40, p.395-400