Browsing by Author "Gieser, H."
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Publication Analysis of HBM ESD testers and specifications using a fourth order lumped element model
Journal article1994, Quality and Reliability Engineering International, 10, p.325-334Publication Characterization and modeling of transient device behavior under CDM ESD stress
Proceedings paper2003, Proceedings 25th EOS/ESD Symposium, 21/09/2003, p.88-97Publication Characterization and modeling of transient device behavior under CMD ESD stress
Journal article2004, Journal of Electrostatics, (62) 2_3, p.133-153Publication Electrothermal device simulation of a gg-nMOSt under HBM ESD conditions
Publication ESD protection elements during HBM stress tests - further numerical and experimental results
Publication ESD protection elements during HBM stress tests - further numerical and experimental results
Publication ESD Protection Elements during HBM Stress Tests - Further Numerical and Experimental Results
Publication Influence of tester, test method and device type on CDM ESD testing
Proceedings paper1994, Proceedings 16th Annual EOS/ESD Symposium, 26/09/1994, p.49-62Publication Influence of tester, test method and device type on CDM ESD testing
Journal article1995, IEEE Trans. Components Packaging and Manufacturing Technology. Part A, (18) 2, p.284-94Publication Investigation into socketed CDM (SDM) tester parasitics
Publication Test circuits for fast and reliable assessment if CDM robustness of I/O stages
Publication Test circuits for fast and reliable assessment of CDM robustness of I/O stages