Browsing by Author "Griffoni, A."
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Publication Effects of heavy-ion strikes on fully depleted SOI MOSFETs with ultra-thin gate oxide and different strain-inducing techniques
Journal article2007, IEEE Trans. Nuclear Science, (54) 6, p.2257-2263Publication Electrostatic discharge effects in fully depleted SOI MOSFETs with ultra-thin gate oxide and different strain-inducing techniques
Proceedings paper2008, 30th Electrical Overstress/Electrostatic Discharge Symposium - EOS/ESD, 7/09/2008, p.59-66Publication ESD sensitivity of 65-nm fully depleted SOI MOSFETs with different strain-inducing techniques
Oral presentation2008, 2nd International Electrostatic Discharge WorkshopPublication Total-ionizing-dose effects on ultrathin-body-and-buried- oxide MOSFETs
Oral presentation2012, IEEE Nuclear and Space Radiation Effects Conference - NSREC