Browsing by Author "Guo, W."
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Publication High-temperature characterization of advanced strained nMUGFETs
; ; Publication Identification de niveaux pièges dans les oxydes de transistors MOS par des mesures de bruit basse-fréquence à différentes températures
Oral presentation2008, Workshop 'Oxydes Fonctionnels pour l'Intégration en Micro- et Nano-électronique'Publication Low temperature noise spectroscopy of 0.1 μm partially depleted silicon on insulator metal-oxide-semiconductor field effect transistors
Journal article2007, Journal of Applied Physics, (101) 10, p.104511Publication Low-frequency noise behavior at low temperature (80K-300K) of silicon passivated Ge pMOSFETs with high-K metal gate stack
Proceedings paper2007, Noise and Fluctuations: 19th International Conference, 9/09/2007, p.29-32Publication Low-frequency noise behavior in p-channel SOI FinFETs processed with different strain techniques
Proceedings paper2009, 20th International Conference on Noise and Fluctuations - ICNF, 14/06/2009, p.298-298Publication Temperature impact on the Lorentzian noise induced by electron valence-band tunneling in partially depleted SOI p-MOSFETs
Journal article2007, Solid-State Electronics, (51) 9, p.1180-1184