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Browsing by Author "Honore, Mia"

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    An in-situ resistance measurement to extract IMC resistivity and kinetic parameter of alternative metallurgies for 3D stacking

    Hou, Lin  
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    Derakhshandeh, Jaber  
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    Radisic, Alex  
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    Honore, Mia
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    De Coster, Jeroen  
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    Cherman, Vladimir  
    Proceedings paper
    2018, 7th Electronic System-Integration Technology Conference - ESTC, 18/09/2018, p.1-8
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    Copper plating for 3D interconnects

    Radisic, Alex  
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    Luhn, Ole
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    Philipsen, Harold  
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    El-Mekki, Zaid  
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    Honore, Mia
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    Rodet, Simon
    Journal article
    2011, Microelectronic Engineering, (88) 5, p.701-704
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    Electrodeposition for 3D integration

    Philipsen, Harold  
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    Radisic, Alex  
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    Luhn, Ole
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    Civale, Yann
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    Vandersmissen, Kevin  
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    Rodet, Simon
    Proceedings paper
    2010, Symposium " Galvanik " Eine etablierte Technik innovativ angewendet, 25/11/2010, p.31-36
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    Electrodeposition of Ø50 × 50 μm Cu pillars for 3D stacking applications

    El-Mekki, Zaid  
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    Radisic, Alex  
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    Philipsen, Harold  
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    Honore, Mia
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    Slabbekoorn, John  
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    Struyf, Herbert  
    Journal article
    2017, Chip Scale Review, (21) 1, p.28-32
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    Electrodeposition of Ø50 × 50 μm Cu pillars for 3D stacking applications

    El-Mekki, Zaid  
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    Philipsen, Harold  
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    Honore, Mia
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    Radisic, Alex  
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    Slabbekoorn, John  
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    Arnold, Marco
    Meeting abstract
    2016, 13th Annual International Wafer-Level Packaging Conference - IWLPC, 18/10/2016
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    Height uniformity of micro-bumps electroplated on thin Cu seed layers

    Yang, Liu
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    Slabbekoorn, John  
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    Honore, Mia
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    Stiers, Karen  
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    Struyf, Herbert  
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    Vereecken, Philippe  
    Meeting abstract
    2016, 229th Electrochemical Society Meeting, 29/05/2016, p.1179
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    Height uniformity of micro-bumps electroplated on thin Cu seed layers

    Yang, Liu
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    Slabbekoorn, John  
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    Honore, Mia
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    Stiers, Karen  
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    Struyf, Herbert  
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    Vereecken, Philippe  
    Proceedings paper
    2016, Silicon Compatible Materials, Processes, and Technologies for Advanced Integrated Circuits and Emerging Applications 6, 29/05/2016, p.145-152
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    Metallization for 3D interconnect processing

    Philipsen, Harold  
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    Civale, Yann
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    Vandersmissen, Kevin  
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    Honore, Mia
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    Inoue, Fumihiro  
    Meeting abstract
    2012, ECS Fall Meeting Symposium E8: Processing Materials of 3D Interconnects, 7/10/2012, p.2717
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    Novell embedded microbump approach for die-to-die and wafer-to-wafer interconnects with variable microbump diameters and down to 5 μm interconnect pitch scaling

    Derakhshandeh, Jaber  
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    Beyne, Eric  
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    Capuz, Giovanni  
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    Inoue, Fumihiro  
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    Cherman, Vladimir  
    Proceedings paper
    2019, 22nd European Microelectronics and Packaging Conference (EMPC), 16/09/2019
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    TSV Cu plating and implications for CMP

    Radisic, Alex  
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    Philipsen, Harold  
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    Honore, Mia
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    Wang, Yu-Shuen
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    Heylen, Nancy  
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    El-Mekki, Zaid  
    Meeting abstract
    2010, 218th Electrochemical Society Meeting, 10/10/2010, p.1991
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    TSV Cu plating and implications for CMP

    Radisic, Alex  
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    Philipsen, Harold  
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    Honore, Mia
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    Wang, Y.S.
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    Heylen, Nancy  
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    El-Mekki, Zaid  
    Proceedings paper
    2011, Electronics and 3-D Packaging 4, 10/10/2011, p.11-21
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    Void-free filling of HAR TSVs using a wet alkaline Cu seed on CVD Co as a replacement for PVD Cu seed

    Armini, Silvia  
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    El-Mekki, Zaid  
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    Vandersmissen, Kevin  
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    Philipsen, Harold  
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    Rodet, Simon
    Journal article
    2011, Journal of the Electrochemical Society, (158) 2, p.H160-H165

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