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Browsing by Author "Hou, Lin"

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    10 and 7 mu m Pitch Thermo-compression Solder Joint, Using A Novel Solder Pillar And Metal Spacer Process

    Derakhshandeh, Jaber  
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    Capuz, Giovanni  
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    Cherman, Vladimir  
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    Inoue, Fumihiro  
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    De Preter, Inge  
    Proceedings paper
    2020, 70th IEEE Electronic Components and Technology Conference (ECTC), JUN 03-30, 2020, p.617-622
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    3D stacking cobalt and nickel microbumps and kinetics of corresponding IMCs at low temperatures

    De Preter, Inge  
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    Derakhshandeh, Jaber  
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    Nagano, Fuya  
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    Houshmand Sharifi, Shamin  
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    Hou, Lin  
    Proceedings paper
    2017, IEEE International Interconnect Technology Conference - IITC, 16/05/2017, p.1-3
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    3D stacking of Co and Ni based microbumps

    De Preter, Inge  
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    Derakhshandeh, Jaber  
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    Hou, Lin  
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    Gerets, Carine  
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    Wang, Teng
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    Rebibis, Kenneth June  
    Proceedings paper
    2016, Electronics System-Integration Technology Conference - ESTC, 13/09/2016, p.1-5
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    3D stacking using bump-less process for sub 10μm pitches

    Derakhshandeh, Jaber  
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    De Preter, Inge  
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    Gerets, Carine  
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    Hou, Lin  
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    Heylen, Nancy  
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    Beyne, Eric  
    Proceedings paper
    2016, IEEE 66th Electronic Components and Technology Conference - ECTC, 31/05/2016, p.128-133
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    A novel in-situ resistance measurement to extract IMC resistivity and kinetic parameter for CoSn 3D stacks

    Hou, Lin  
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    Derakhshandeh, Jaber  
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    De Coster, Jeroen  
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    Wang, Teng
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    Cherman, Vladimir  
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    Bex, Pieter  
    Proceedings paper
    2017, IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference - IEEE S3S, 16/10/2017, p.7.4
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    A novel intermetallic compound insertion bonding to improve throughput for 3D die to wafer stacking

    Hou, Lin  
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    Derakhshandeh, Jaber  
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    Capuz, Giovanni  
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    Lofrano, Melina  
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    Beyne, Eric  
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    Miller, Andy  
    Proceedings paper
    2020, 2020 IEEE 70th Electronic Components and Technology Conference (ECTC), 26/05/2020
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    A novel intermetallic compound insertion bonding to improve throughput for sequential 3D stacking

    Hou, Lin  
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    Derakhshandeh, Jaber  
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    Capuz, Giovanni  
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    Beyne, Eric  
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    De Wolf, Ingrid  
    Journal article
    2020, IEEE Transactions on Components, Packaging and Manufacturing Technology, (10) 4, p.669-678
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    A novel iso-thermal intermetallic compound insertion bonding approach to improve throughput for 3D die to wafer stacking

    Hou, Lin  
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    Derakhshandeh, Jaber
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    Capuz, Giovanni
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    Lofrano, Melina
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    Beyne, Eric
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    Miller, Andy
    Proceedings paper
    2020, 70th IEEE Electronic Components and Technology Conference (ECTC), JUN 03-30, 2020, p.1442-1447
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    A novel resistance measurement methodology for in-situ UBM/Solder interfacial reaction monitoring

    Hou, Lin  
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    Derakhshandeh, Jaber  
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    Beyne, Eric  
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    De Wolf, Ingrid  
    Journal article
    2020, IEEE Transactions on Components, Packaging and Manufacturing Technology, (10) 1, p.30-38
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    A study on IMC morphology and integration flow for low temperature and high throughput TCB down to 10 mu m pitch microbumps

    Derakhshandeh, Jaber  
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    Gerets, Carine  
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    Inoue, Fumihiro  
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    Capuz, Giovanni  
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    Cherman, Vladimir  
    Proceedings paper
    2021, IEEE 71st Electronic Components and Technology Conference (ECTC), JUN 01-JUL 04, 2021, p.1119-1124
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    An in-situ resistance measurement to extract IMC resistivity and kinetic parameter of alternative metallurgies for 3D stacking

    Hou, Lin  
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    Derakhshandeh, Jaber  
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    Radisic, Alex  
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    Honore, Mia
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    De Coster, Jeroen  
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    Cherman, Vladimir  
    Proceedings paper
    2018, 7th Electronic System-Integration Technology Conference - ESTC, 18/09/2018, p.1-8
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    Cobalt UBM for fine pitch microbump applications in 3DIC

    Derakhshandeh, Jaber  
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    De Preter, Inge  
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    Vandersmissen, Kevin  
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    Dictus, Dries  
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    Di Piazza, Luca  
    Proceedings paper
    2015, IEEE International Interconnect Technology Conference - IITC / Materials for Advanced Metallization Conference - MAM, 18/05/2015, p.221-224
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    Comparing SAM (Self-Assembled Monolayer) deposition methods to passivate copper microbumps for 3D stacking

    Houshmand Sharifi, Shamin  
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    Derakhshandeh, Jaber  
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    Armini, Silvia  
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    De Preter, Inge  
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    Bex, Pieter  
    Meeting abstract
    2017, Materials for Advanced Metallization Conference - MAM, 26/03/2017
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    Die to wafer 3D stacking for below 10μm pitch microbumps

    Derakhshandeh, Jaber  
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    Hou, Lin  
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    De Preter, Inge  
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    Gerets, Carine  
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    Suhard, Samuel  
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    Dubey, Vikas
    Proceedings paper
    2016, IEEE International Conference on 3D System Integration - 3DIC, 9/11/2016, p.1-4
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    ELD NiB for microbumps passivation and wirebonding

    Derakhshandeh, Jaber  
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    De Preter, Inge  
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    El-Mekki, Zaid  
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    Hou, Lin  
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    Gerets, Carine  
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    Dictus, Dries  
    Proceedings paper
    2020, 8th IEEE Electronics System-Integration Technology Conference (ESTC), SEP 15-18, 2020
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    Electrochemical deposition of Sn-Cu alloys for applications in 3D stacking in microelectronics industry

    Inoue, Fumihiro  
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    El-Mekki, Zaid  
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    Struyf, Herbert  
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    Hou, Lin  
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    Derakhshandeh, Jaber  
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    Beyne, Eric  
    Meeting abstract
    2020, Electrochemical Society Spring Meeting Symposium E03: Electrodeposition of Alloys, Intermetallic Compounds, and Eutectics, 10/05/2020
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    Growth rate of IMC in the binary sytems of Co/Sn and Cu/Sn

    Nagano, Fuya  
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    Kajihara, Masanori
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    Derakhshandeh, Jaber  
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    Hou, Lin  
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    Van De Peer, Myriam  
    Proceedings paper
    2017, IEEE International Interconnect Technology Conference - IITC, 16/07/2017, p.1-3
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    Impact of ELD layers in mechanical properties of microbumps for 3D stacking

    Hou, Lin  
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    Derakhshandeh, Jaber  
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    De Preter, Inge  
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    Vandersmissen, Kevin  
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    Rebibis, Kenneth June  
    Proceedings paper
    2016, 6th Electronics System-Integration Technology Conference - ESTC, 13/09/2016, p.1-5
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    Mechanical and thermal investigation of a novel intermetallic insertion bonding for 3D stack

    Lofrano, Melina  
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    Hou, Lin  
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    Derakhshandeh, Jaber  
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    Cherman, Vladimir  
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    Beyne, Eric  
    Proceedings paper
    2020, imaps MiNaPAD2020, 27/05/2020
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    Morphology of IMC in the binary systems of Co/Sn and Cu/Sn

    Nagano, Fuya  
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    Derakhshandeh, Jaber  
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    Hou, Lin  
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    Van De Peer, Myriam  
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    De Preter, Inge  
    Meeting abstract
    2017, Materials for Advanced MetallizationConference - MAM, 26/03/2017
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