Browsing by Author "Job, R."
- Results Per Page
- Sort Options
Publication A low temperature technology on the base of hydrogen enhanced thermal donor formation for future high voltage applications
Proceedings paper2002, Proceedings of the 11th International Workshop on Physics of Semiconductor Devices, 11/12/2001, p.405-413Publication Analysis of oxygen thermal donor formation in n-type CZ silicon
Proceedings paper2003, Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes, 28/04/2003, p.96-105Publication Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon
; ;Claeys, Cor; ;De Gryse, O. ;Clauws, P. ;Job, R. ;Ulyashin, A.G.Fahrner, W.Journal article2003, Materials Science and Engineering B, (102) 1_3, p.207-212Publication Combined electrical and spectroscopic investigation of thermal donor formation in plasma-hydrigenated n-type czochralski silicon
;Rafi, Joan Marc; ;Claeys, Cor ;Ulyashin, Aliaksandr ;Huang, Y.L. ;Job, R.Lauwaert, J.Meeting abstract2004, International Scientific Meeting Belgian Physical Society. Abstracts Book, 25/06/2004, p.74Publication Comparison of electron irradiation effect on thermal donors in Cz and oxygen doped FZ silicon
;Takakura, K. ;Ohyama, H. ;Yoshida, T. ;Murakawa, H. ;Rafi, Joan Marc ;Job, R.Ulyashin, A.Journal article2003, Physica B, 340-342, p.1022-1025Publication Deep levels in oxygenated n-type high-resistivity FZ silicon before and after a low-temperature hydrogenation step
Journal article2003, Journal of the Electrochemical Society, (150) 9, p.G520-G526Publication DLTS study on deep levels formed in plasma hydrogenated and subsequently annealed silicon
Proceedings paper2005, Gettering and Defect Engineering in Semiconductor Technology XI. Proceedings of the 11th International Autumn Meeting, 25/09/2005, p.547-552Publication Doping of oxidized float zone silicon by thermal donors- a low thermal budget doping method for device applications?
Proceedings paper2002, Defect- and Impurity-Engineered Semiconductors and Devices III, 1/04/2002, p.F9.5Publication Effect of electron irradiation on thermal donors in oxygen-doped high-resistivity FZ Si
;Takakura, K. ;Ohyama, H. ;Yoshida, T. ;Murakawa, H. ;Rafi, Joan Marc ;Job, R.Ulyashin, A.Proceedings paper2004, Gettering and Defect Engineering in Semiconductor Technology - GADEST 2003, 21/09/2003, p.53-58Publication Effect of electron irradiation on thermal donors in oxygen-doped high-resistivity FZ Si
;Takakura, K. ;Ohyama, H. ;Yoshida, T. ;Murakawa, H. ;Rafi, Joan Marc ;Job, R.Ulyashin, A.Oral presentation2003, Gettering and Defect Engineering in Semiconductor Technology - GADESTPublication Electron irradiation effect on thermal donors in CZ-Si
;Takakura, K. ;Ohyama, H. ;Murakawa, H. ;Yoshida, T. ;Rafi, Joan Marc ;Job, R.Ulyashin, A.Journal article2004, European Physical Journal - Applied Physics, 27, p.133-135Publication Electron irradiation effects on thermal donors in Cz-Si
;Takakura, K. ;Ohyama, Hidenori ;Murakawa, H. ;Yoshida, T. ;Rafi, Joan Marc ;Job, R.Ulyashin, A.Oral presentation2003, 10th Int. Conf. on Defect Recognition, Imaging and Physics of Semiconductors - DRIP XPublication Hydrogen enhanced thermal donor formation in oxygen enriched high resistive float-zone silicon
Journal article2002, Nuclear Instruments & Methods in Physics Research B, (186) 1_4, p.116-120Publication Hydrogen plasma-enhanced thermal donor formation in n-type oxygen-doped high-resistivity float-zone silicon
Journal article2002, Applied Physics Letters, (81) 10, p.1842-1844Publication Hydrogen-induced thermal donor formation in n-type oxygenated high-resistivity FZ silicon
Proceedings paper2002, Proceedings of the 5th Annual Workshop on Semiconductor Advances for Future Electronics - SAFE, 26/11/2002, p.91-98Publication Hydrogen-plasma-enhanced thermal donor formation in n-type high-ressitivity MCZ silicon
Proceedings paper2005, Crystalline Defects and Contamination: Their Impact and Control in Device Manufacturing IV, 16/09/2005, p.165-175Publication Impact of direct plasma hydrogenation on thermal donor formation in N-type CZ silicon
Journal article2005, Journal of the Electrochemical Society, (152) 1, p.G16-G24Publication Low temperature doping of silicon by hydrogen plasma treatments
Proceedings paper2002, High Purity Silicon VII, 20/10/2002, p.141-154Publication Minority carrier lifetime improvement in p-type silicon by oxygen related centers gettering at low temperatures: application to the heterojunction solar cell processing
Oral presentation2003, 10th Int. Autumn Meeting on Gettering and Defect Engineering in Semiconductor Technology - GADESTPublication Minority carrier lifetime improvement in p-type silicon by oxygen related centers gettering at low temperatures: application to the interojunction solar cell processing
Proceedings paper2003, Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion, 11/05/2003, p.1088-1091