Browsing by Author "Kosemura, Daisuke"
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Publication Comparison of NBTI aging on adder architectures and ring oscillators in the downscaled technologies
Journal article2015, Microprocessors and Microsystems, (39) 8, p.1039-1051Publication Correlation between temperature dependence of Raman shifts and in-plane strains in an AlGaN/GaN stack
Journal article2017, Journal of Applied Physics, (121) 3, p.35702Publication Edge trimming for wafer-to-wafer 3D integration
Proceedings paper2016, Materials for Advanced Metallization Conference - MAM, 20/03/2015, p.P3D-03Publication Edge trimming induced defects on direct bonded wafers
Journal article2018, Journal of Electronic Packaging, (140) 3, p.31004Publication Edge-enhanced Raman scattering in narrow sGe fin field-effect transistor channels
Journal article2015, Applied Physics Letters, (106) 3, p.33107Publication Experimental benchmarking of electrical methods and $l-Raman spectroscopy for channel temperature detection in AlGaN/GaN HEMTs
Journal article2016, IEEE Transactions on Electron Devices, (63) 6, p.2321-2327Publication Stress measurements in semiconductor devices using nano-focused Raman spectroscopy
Proceedings paper2016, 14th International Conference on Reliability and Stress-Related Phenomena in Nanoelectronics - Experiment and Simulation - IRSP, 30/05/2016Publication Three-dimensional micro-Raman spectroscopy mapping of stress induced in Si by Cu-filled through-Si vias