Browsing by Author "Lambrecht, Niels"
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Publication A circuit modeling technique for the ISO 7637-3 capacitive coupling clamp test
Journal article2018-08, IEEE Transactions on Electromagnetic Compatibility, (60) 4, p.858-865Publication Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust automotive integrated circuits
Proceedings paper2017-07, 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits - EMCCompo, 4/07/2017, p.141-145Publication Machine learning based error detection in transient susceptibility tests
Journal article2019-04, IEEE Transactions on Electromagnetic Compatibility, (61) 2, p.352-360Publication Modeling of contact bounce in a transient electromagnetic compatibility test for the analysis and optimization of nonlinear devices
Journal article2017, IEEE Transactions on Electromagnetic Compatibility, (59) 2, p.541-544Publication Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test
Proceedings paper2017-09, International Symposium on Electromagnetic Compatibility - EMC EUROPE, 4/09/2017, p.1-5Publication Modellering van complexe EMC-testopstellingen voor de transiëntanalyse van geïntegreerde schakelingen in de automobielindustrie
Lambrecht, NielsPHD thesis2018-04