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Browsing by Author "Lambrecht, Niels"

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    A circuit modeling technique for the ISO 7637-3 capacitive coupling clamp test

    Lambrecht, Niels
    ;
    Pues, H.
    ;
    De Zutter, Daniel  
    ;
    Vande Ginste, Dries  
    Journal article
    2018-08, IEEE Transactions on Electromagnetic Compatibility, (60) 4, p.858-865
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    Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust automotive integrated circuits

    Lambrecht, Niels
    ;
    De Zutter, Daniel  
    ;
    Vande Ginste, Dries  
    ;
    Pues, Hugo
    Proceedings paper
    2017-07, 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits - EMCCompo, 4/07/2017, p.141-145
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    Machine learning based error detection in transient susceptibility tests

    Medico, Roberto  
    ;
    Lambrecht, Niels
    ;
    Pues, Hugo
    ;
    Vande Ginste, Dries  
    ;
    Deschrijver, Dirk  
    Journal article
    2019-04, IEEE Transactions on Electromagnetic Compatibility, (61) 2, p.352-360
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    Modeling of contact bounce in a transient electromagnetic compatibility test for the analysis and optimization of nonlinear devices

    Lambrecht, Niels
    ;
    Pues, Hugo
    ;
    De Zutter, Daniel  
    ;
    Vande Ginste, Dries  
    Journal article
    2017, IEEE Transactions on Electromagnetic Compatibility, (59) 2, p.541-544
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    Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test

    Lambrecht, Niels
    ;
    De Zutter, Daniel  
    ;
    Vande Ginste, Dries  
    ;
    Pues, Hugo
    Proceedings paper
    2017-09, International Symposium on Electromagnetic Compatibility - EMC EUROPE, 4/09/2017, p.1-5
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    Modellering van complexe EMC-testopstellingen voor de transiëntanalyse van geïntegreerde schakelingen in de automobielindustrie

    Lambrecht, Niels
    PHD thesis
    2018-04

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