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Browsing by Author "Loewenstein, Lee"

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    Adsorption of metal ions onto hydrophilic silicon surfaces from aqueous solution: effect of pH

    Loewenstein, Lee
    ;
    Mertens, Paul  
    Journal article
    1998, J. Electrochem. Soc., (145) 8, p.2841-2847
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    Advanced cleaning for the growth of ultrathin gate oxide

    Mertens, Paul  
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    Bearda, Twan
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    Houssa, Michel  
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    Loewenstein, Lee
    ;
    Cornelissen, Ingrid  
    Journal article
    1999, Microelectronic Engineering, (48) 1_4, p.199-206
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    Advanced cleaning strategies for ultra-clean silicon surfaces

    Heyns, Marc  
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    Bearda, Twan
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    Cornelissen, Ingrid  
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    De Gendt, Stefan  
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    Loewenstein, Lee
    ;
    Mertens, Paul  
    Proceedings paper
    1999, Proceedings of the 9th International Conference on Production Engineering - ICPE, 29/08/1999, p.459
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    Advances in understanding wet cleaning technology and the effect of metal contamination

    Heyns, Marc  
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    Bearda, Twan
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    Cornelissen, Ingrid  
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    De Gendt, Stefan  
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    Loewenstein, Lee
    ;
    Mertens, Paul  
    Meeting abstract
    1999, Electrochemical Society Fall Meeting: 6th International Symposium on Cleaning Technology in Semiconductor Device Manufacturing, 17/10/1999, p.1061
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    Behaviour of metallic contaminants during MOS processing

    Bearda, Twan
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    De Gendt, Stefan  
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    Loewenstein, Lee
    ;
    Knotter, Martin
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    Mertens, Paul  
    ;
    Heyns, Marc  
    Proceedings paper
    1999, Ultra Clean Processing of Silicon Surfaces; Proceedings of the 4th International Symposium on Ultra Clean Processing of Silicon, 21/09/1998, p.11-14
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    Behaviour of metallic contaminants during MOS processing

    Bearda, Twan
    ;
    De Gendt, Stefan  
    ;
    Loewenstein, Lee
    ;
    Knotter, Martin
    ;
    Mertens, Paul  
    ;
    Heyns, Marc  
    Oral presentation
    1998, 4th International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS
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    Chemistry of the silicon oxide surface: adsorption from SC1 solutions

    Hall, L.
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    Sees, J.
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    Hurd, Trace
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    Schmidt, B.
    ;
    Bellay, L.
    ;
    Loewenstein, Lee
    ;
    Mertens, Paul  
    Oral presentation
    1998, 4th International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS
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    Chemistry of the silicon oxide surface: adsorption from SC1 solutions

    Hall, L.
    ;
    Sees, J.
    ;
    Hurd, Trace
    ;
    Schmidt, B.
    ;
    Bellay, L.
    ;
    Loewenstein, Lee
    ;
    Mertens, Paul  
    Proceedings paper
    1999, Ultra Clean Processing of Silicon Surfaces; Proceedings of the 4th International Symposium on Ultra Clean Processing of Silicon, 21/09/1998, p.53-58
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    Competititive adsorption of cations onto the silicon surface: the role of the ammonium ion in ammonia-peroxide solution

    Loewenstein, Lee
    ;
    Mertens, Paul  
    Proceedings paper
    2000, Cleaning Technology in Semiconductor Device Manufacturing. Proceedings of the 6th International Symposium, 17/10/1999, p.512-19
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    Competitive adsorption of cations onto the silicon surface. The role of the ammonium ion in ammonia-peroxide solution

    Loewenstein, Lee
    ;
    Mertens, Paul  
    Journal article
    1999, J. Electrochem. Soc., (146) 10, p.3886-3889
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    Competitive adsorption of cations onto the silicon surface: the role of ammonium ion in APM

    Loewenstein, Lee
    ;
    Mertens, Paul  
    Meeting abstract
    1999, Electrochemical Society Fall Meeting: 6th International Symposium on Cleaning Technology in Semiconductor Device Manufacturing, 17/10/1999, p.1070
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    Competitive adsorption of metal ions onto hydrophilic silicon surfaces from aqueous solutions

    Loewenstein, Lee
    ;
    Charpin, Florence
    ;
    Mertens, Paul  
    Journal article
    1999, J. Electrochem. Soc., (146) 2, p.719-727
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    Cost-effective cleaning and high-quality thin gate oxides

    Heyns, Marc  
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    Bearda, Twan
    ;
    Cornelissen, Ingrid  
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    De Gendt, Stefan  
    ;
    Degraeve, Robin  
    Journal article
    1999, IBM Journal of Research and Development, (43) 3, p.339-350
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    Cost-effective cleaning for advanced Si-processing

    Heyns, Marc  
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    Bearda, Twan
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    Cornelissen, Ingrid  
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    De Gendt, Stefan  
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    Knotter, D. M.
    ;
    Loewenstein, Lee
    Proceedings paper
    1998, Technical Digest International Electron Devices Meeting - IEDM, 6/12/1998, p.325-328
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    Developments in cleaning technology for critical layers

    Heyns, Marc  
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    Arnauts, Sophia  
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    Bearda, Twan
    ;
    Claes, M.
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    Cornelissen, Ingrid  
    ;
    De Gendt, Stefan  
    Oral presentation
    2000, Santa Clara Plastics Symposium on Cleaning Technology; May 2000
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    DI water purity concerns for post-clean rinsing

    Loewenstein, Lee
    ;
    Mertens, Paul  
    Proceedings paper
    1998, 7th International Symposium on Semiconductor Manufacturing, 7/10/1998, p.432-435
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    Distribution of metal contamination in SiO2/Si systems

    Mertens, Paul  
    ;
    Jacobs, Leon
    ;
    Goris, Karen
    ;
    Kenis, Karine  
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    Loewenstein, Lee
    ;
    Teerlinck, Ivo
    Meeting abstract
    1999, Electrochemical Society Fall Meeting: 6th International Symposium on Cleaning Technology in Semiconductor Device Manufacturing, 17/10/1999, p.1107
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    Effect of metal contamination and improved cleaning strategies

    Mertens, Paul  
    ;
    Bearda, Twan
    ;
    Loewenstein, Lee
    ;
    Martin, A.R.
    ;
    Hub, W.
    ;
    Kolbesen, B. O.
    Proceedings paper
    1999, Defects in Silicon III, 2/05/1999, p.401-413
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    Effect of metal contamination and improved cleaning strategies

    Mertens, Paul  
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    Bearda, Twan
    ;
    Loewenstein, Lee
    ;
    Martin, Andreas
    ;
    Hub, Walter
    ;
    Kolbesen, Bernd
    Proceedings paper
    1999, 6th International SCP Symposium "Meeting the Surface Preparation Challenges of the New Millennium", 10/05/1999
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    Efficiency of ozonated DI water in removing organic contamination

    Kenens, Conny
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    De Gendt, Stefan  
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    Knotter, D. M.
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    Loewenstein, Lee
    ;
    Meuris, Marc  
    Proceedings paper
    1998, Proceedings of the 5th International Symposium on Cleaning Technology in Semiconductor Device Manufacturing, 31/08/1997, p.247-255
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