Browsing by Author "Luo, Xuyi"
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Publication Low-Frequency Noise and Border Traps in Irradiated nMOS and pMOS Bulk Si FinFETs With SiO2/HfO2 Gate Dielectrics
Journal article2023, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (70) 4, p.442-448Publication Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs
; ; Reed, Robert A.Journal article2023, IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, (23) 1, p.153-161Publication Negative-Bias-Stress and Total-Ionizing-Dose Effects in Deeply Scaled Ge-GAA Nanowire pFETs
Journal article2022, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (69) 3, p.299-306Publication Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors