Browsing by Author "Menozzi, R."
Now showing 1 - 8 of 8
- Results Per Page
- Sort Options
Publication Hot electron degradation effects in Al0.25Ga0.75As/In0.2Ga0.8As/GaAs PHEMTs
Publication Material and process related limitations of In P HEMT performance
Journal article1997, Materials Science and Engineering B, (44) 1_3, p.311-315Publication Modelling of low-frequency dispersive effects in GaAs and InP HEMTs
Publication On the correlation between drain-gate breakdown voltage and hot-electron reliability in InP HEMT's
Journal article1999, IEEE Electron Device Letters, (20) 4, p.152-154Publication On the effects of hot electrons on the DC and RF characteristics of lattice-matched InAlAs/InGaAs/InP HEMT's
Publication Reliability testing of InP HEMT's using electrical stress methods
Journal article1999, IEEE Trans. Electron Devices, (46) 8, p.1570-1576Publication The effect of hot electron stress on the DC and microwave characteristics of AlGaAs/InGaAs/GaAs PHEMTs
Publication The effect of passivation on the hot electron degradation of lattice-matched InAlAs/InGaAs/InP HEMTs