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Browsing by Author "Meynen, H."

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    An analysis of the reliability of a wafer level package (WLP) using a silicon under the bump (SUB) configuration

    Gonzalez, Mario  
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    Vandevelde, Bart  
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    Vanden Bulcke, Mathieu  
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    Winters, Christophe  
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    Beyne, Eric  
    Proceedings paper
    2003, Proceedings of the 53rd Electronic Components and Technology Conference, 27/05/2003, p.858-863
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    Integration of low stress photopatternable silicones into a wafer level package

    Gardner, G.
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    Harkness, B.
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    Ohare, E.
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    Meynen, H.
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    Vanden Bulcke, Mathieu  
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    Gonzalez, Mario  
    Proceedings paper
    2004-06, Proceedings of the 54th Electronic Components and Technology Conference - ECTC, 1/06/2004, p.170-174
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    Introducing a silicone under the bump configuration for stress relief in a wafer level package

    Vanden Bulcke, Mathieu  
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    Gonzalez, Mario  
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    Vandevelde, Bart  
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    Winters, Christophe  
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    Beyne, Eric  
    Proceedings paper
    2003, Proceedings EPTC - Electronics Packaging Technology Conference, 11/12/2003, p.380-384
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    Optimization of a silicone under the bump (SUB) structure for wafer level packaging

    Gonzalez, Mario  
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    Vandevelde, Bart  
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    Vanden Bulcke, Mathieu  
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    Winters, Christophe  
    ;
    Beyne, Eric  
    Proceedings paper
    2003, Proceedings of the 14th European Microelectronic Packaging Conference and Exhibition - IMAPS Europe, 23/06/2003, p.479-484
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    Process optimization and integration of trimethylsilane-deposited a-SiC:H and a-SiCO:H dielectric thin films for damascene processing

    Gray, W.D.
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    Loboda, M.J.
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    Bremmer, J.N.
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    Struyf, Herbert  
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    Lepage, Muriel
    ;
    Van Hove, Marleen
    Journal article
    2003, Journal of the Electrochemical Society, (150) 7, p.G404-G411

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