Browsing by Author "Mieville, Jean-Paul"
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Publication An optimized poly-buffered LOCOS process for a 0.35 µm CMOS technology
Proceedings paper1994, 24th European Solid State Device Research Conference - ESSDERC, 11/09/1994, p.199-202Publication Analysis and optimisation of the hot-carrier degradation performance of 0.35μm fully overlapped LDD devices
Proceedings paper1995, 33rd Annual IEEE International Reliability Physics Conference - IRPS, 4/05/1995, p.254-259Publication FOND (Fully Overlapped Nitride-Etch Defined Device): A New Device Architecture for High-Reliability and High-Performance Deep Submicron CMOS Technology
Proceedings paper1994, Technical Digest International Electron Devices Meeting - IEDM, 12/12/1994, p.4.5.1-4.5.4Publication Performance and reliability aspects of FOND: A new deep submicron CMOS device concept
Journal article1996, IEEE Transactions on Electron Devices, (43) 9, p.1407-1415Publication Study of the hot-carrier degradation performance of 0.35 μm fully overlapped LDD devices
Journal article1995, Microelectronic Engineering, 28, p.265-268