Repository logo Institutional repository
  • Communities & Collections
  • Browse
  • Site
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "Montgomery, Patrick"

Filter results by typing the first few letters
Now showing 1 - 6 of 6
  • Results Per Page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    Arf solutions for low-k1 back-end imaging

    Wiaux, Vincent  
    ;
    Montgomery, Patrick
    ;
    Vandenberghe, Geert  
    ;
    Monnoyer, Philippe
    ;
    Ronse, Kurt  
    Proceedings paper
    2003, Optical Microlithography XVI, 23/02/2003, p.270-281
  • Loading...
    Thumbnail Image
    Publication

    Complementary phase-shift mask towards 70-nm technology node

    Driessen, Frank
    ;
    Vandenberghe, Geert  
    ;
    Ercken, Monique  
    ;
    Montgomery, Patrick
    ;
    Ronse, Kurt  
    Proceedings paper
    2002, Optical Microlithography XV, 5/03/2002, p.Addendum
  • Loading...
    Thumbnail Image
    Publication

    High-NA ArF lithography for 70-nm technologies

    Montgomery, Patrick
    ;
    Vandenberghe, Geert  
    ;
    Lucas, Kevin
    Proceedings paper
    2002, Optical Microlithography XV, 5/03/2002, p.1613-1624
  • Loading...
    Thumbnail Image
    Publication

    Mighty hight-t lithography for 65nm generation contacts

    Conley, Will
    ;
    Montgomery, Patrick
    ;
    Lucas, Kevin
    ;
    Litt, Lloyd C.
    ;
    Maltabes, John G.
    ;
    Dieu, Laurent
    Proceedings paper
    2003, Optical Microlithography XVI, 23/02/2003, p.1210-1219
  • Loading...
    Thumbnail Image
    Publication

    Model-based design improvements for the 100nm lithography generation

    Lucas, Kevin
    ;
    Postnikov, Sergei
    ;
    Patterson, Kyle
    ;
    Yuan, Min-Chi
    ;
    Thomas, Carla
    ;
    Thompson, Matt
    Proceedings paper
    2002, Optical Microlithograhy XV, 5/03/2002, p.215-226
  • Loading...
    Thumbnail Image
    Publication

    Process, design and optical proximity correction requirements for the 65nm device generation

    Lucas, Kevin
    ;
    Montgomery, Patrick
    ;
    Litt, Lloyd C.
    ;
    Conley, Will
    ;
    Postnikov, Sergei V.
    ;
    Wu, Wei
    Proceedings paper
    2003, Optical Microlithography XVI, 23/02/2003, p.408-419

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings