Browsing by Author "Naem, Abdalla"
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Publication 0.13µm CMOS technology with optimized poly-Si / NO-oxide gate stack
Proceedings paper1999, ULSI Process Integration. Proceedings of the First International Symposium, 17/10/1999, p.193-202Publication Analysis of leakage currents and impact on off-state power consumption for CMOS technology in the 100-nm regime
Journal article2000, IEEE Trans. Electron Devices, (47) 7, p.1393-1400Publication Closed form inductance calculation for integrated spiral inductor compact modeling
Proceedings paper2000, Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems. Digest of Papers, 26/04/2000, p.131-135Publication Effect of implantation oxide on the silicidation of narrow diffused and poly-lines
Oral presentation1997, Materials Research Society 1997 Spring Meeting : Symposium on Multilevel Metal Process Integration; April 1-2, 1997; San FrancisPublication Effect of implantation oxide on the Ti- and Co-silicidation of narrow diffusion and poly-lines
Journal article1998, Thin Solid Films, 320, p.122-127Publication Gate stack optimisation for advanced CMOS process
Proceedings paper1999, ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium., p.412-415Publication High density 3-D stack structure for SIP solutions
Proceedings paper2003, 14th European Microelectronics and Packaging Conference & Exhibition - EMPC, 23/02/2003, p.341-343Publication Influence of device geometry on ESD performance for deep submicron CMOS technology
Proceedings paper1999, Tagungsband 6th ESD-Forum; October 1999; München, Germany., p.83-93Publication Influence of gate length on ESD performance for deep submicron CMOS technology
Proceedings paper1999, Electrical Overstress/Electrostatic Discharge Symposium Proceedings - EOS-ESD, 28/09/1999, p.95-104Publication Influence of gate length on ESD-performance for deep submicron CMOS technology
Journal article2001, Microelectronics Reliability, (41) 3, p.375-383Publication Integrated passives for a DECT VCO
Journal article2000, IMAPS International Journal of Microcircuits and Electronic Packaging, (23) 3, p.325-331Publication Integrated passives for a DECT VCO
Proceedings paper2000, Proceedings IMAPS International Conference and Exhibition on High Density Interconnect and Systems Packaging - HDI, 26/04/2000, p.537-541Publication Investigation of instrinsic transistor performance of advanced CMOS devices with 2.5 nm NO gate oxides
Proceedings paper1999, International Electron Devices Meeting. Technical Digest; 5-8 Dec. 1999; Washington, D.C., USA., p.823-826Publication Realisation of a DECT VCO circuit with MCM-D technology
Proceedings paper1999, ICM'99. The eleventh international conference on microelectronics. Proceedings; 22-24 November 1999; Kuwait., p.141-144Publication Temperature acceleration of oxide breakdown and its impact on ultra-thin gate oxide reliability
Proceedings paper1999, Symposium on VLSI Technology: Technical Digest; June 1999; Kyoto, Japan., p.59-60