Browsing by Author "Nakamura, H."
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Publication 12-EUV layer Surrounding Gate Transistor (SGT) for vertical 6-T SRAM: 5-nm-class technology for ultra-density logic devices
; ;Harada, N.; ; ; Huynh Bao, TrongProceedings paper2019, 2019 Symposium on VLSI Technology, 9/06/2019, p.T15-1Publication DTCO and TCAD for a 12 layer-EUV ultra-scaled surrounding gate transistor 6T-SRAM
Proceedings paper2018, 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 24/09/2018, p.45-48Publication Effects of electron and proton radiation on embedded SiGe source/drain diodes
;Ohyama, H. ;Nagano, T. ;Takakura, K. ;Motoki, M. ;Matsuo, M. ;Nakamura, H. ;Sawada, M.Midorikawa, M.Journal article2008, Materials Science in Semiconductor Processing, (11) 5_6, p.310-313Publication Effects of electron irradiation on SiGe devices
;Ohyama, Hidenori ;Nagano, T. ;Takakura, K. ;Motoki, M. ;Matsuo, K. ;Nakamura, H.Sawada, M.Journal article2010, Thin Solid Films, (518) 9, p.2517-2520Publication Interconnects for scaled SRAM with vertical Surrounded Gate Transistors (SGT)
Proceedings paper2019, IEEE International Interconnect Technology Conference (IITC 2019) and Materials for Advanced Metallization Conference (MAM 2019), 3/06/2019, p.2.5Publication Radiation damage of Ge diodes and MOSFETs on Ge-on-Si substrates
;Nakamura, H. ;Nagano, T. ;Sukizaki, H. ;Sakamoto, K. ;Takakura, K. ;Ohyama, H.Kuboyama, S.Oral presentation2008, 8th International Workshop on Radiation Effects on Semiconductor Devices for Space ApplicationsPublication Radiation damage of Ge-on-Si devices
;Ohyama, H. ;Sakamoto, K. ;Sukizaki, H. ;Takakura, K. ;Hayama, K. ;Motoki, M. ;Matsuo, K.Nakamura, H.Journal article2008, Materials Science in Semiconductor Processing, (11) 5_6, p.217-220