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Browsing by Author "Nakamura, H."

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    12-EUV layer Surrounding Gate Transistor (SGT) for vertical 6-T SRAM: 5-nm-class technology for ultra-density logic devices

    Kim, Min-Soo  
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    Harada, N.
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    Kikuchi, Yoshiaki  
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    Boemmels, Juergen  
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    Mitard, Jerome  
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    Huynh Bao, Trong
    Proceedings paper
    2019, 2019 Symposium on VLSI Technology, 9/06/2019, p.T15-1
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    DTCO and TCAD for a 12 layer-EUV ultra-scaled surrounding gate transistor 6T-SRAM

    Matagne, Philippe  
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    Nakamura, H.
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    Kim, Min-Soo  
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    Kikuchi, Yoshiaki  
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    Huynh Bao, Trong
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    Tao, Zheng  
    Proceedings paper
    2018, 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 24/09/2018, p.45-48
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    Effects of electron and proton radiation on embedded SiGe source/drain diodes

    Ohyama, H.
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    Nagano, T.
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    Takakura, K.
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    Motoki, M.
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    Matsuo, M.
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    Nakamura, H.
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    Sawada, M.
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    Midorikawa, M.
    Journal article
    2008, Materials Science in Semiconductor Processing, (11) 5_6, p.310-313
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    Effects of electron irradiation on SiGe devices

    Ohyama, Hidenori
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    Nagano, T.
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    Takakura, K.
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    Motoki, M.
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    Matsuo, K.
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    Nakamura, H.
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    Sawada, M.
    Journal article
    2010, Thin Solid Films, (518) 9, p.2517-2520
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    Interconnects for scaled SRAM with vertical Surrounded Gate Transistors (SGT)

    Boemmels, Juergen  
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    Harada, N.
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    Kim, Min-Soo  
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    Mitard, Jerome  
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    Kikuchi, Yoshiaki  
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    Li, Waikin  
    Proceedings paper
    2019, IEEE International Interconnect Technology Conference (IITC 2019) and Materials for Advanced Metallization Conference (MAM 2019), 3/06/2019, p.2.5
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    Radiation damage of Ge diodes and MOSFETs on Ge-on-Si substrates

    Nakamura, H.
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    Nagano, T.
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    Sukizaki, H.
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    Sakamoto, K.
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    Takakura, K.
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    Ohyama, H.
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    Kuboyama, S.
    Oral presentation
    2008, 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications
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    Radiation damage of Ge-on-Si devices

    Ohyama, H.
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    Sakamoto, K.
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    Sukizaki, H.
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    Takakura, K.
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    Hayama, K.
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    Motoki, M.
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    Matsuo, K.
    ;
    Nakamura, H.
    Journal article
    2008, Materials Science in Semiconductor Processing, (11) 5_6, p.217-220

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