Browsing by Author "O'Neill, A.G."

1/f noise study on strained Si0.8Ge0.2 p-channel MOSFETs with high-k/poly Si gate stack

Application of a nano-mechanical sensor to monitor stress in copper damascene interconnects

In-situ growth of Cu-Mn alloy self-forming barriers in 100 nm Cu/Low-k damascene interconnects

Quantifying self-heating effects with scaling in globally strained Si MOSFETS

Strained Si/SiGe MOS technology

Synchrotron measurement of the effect of line-width scaling on stress in advanced Cu/Low-k interconnects

Thermal stability of supercritical thickness-strained Si layers on thin strain-relaxed buffers