Browsing by Author "Pues, Hugo"
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Publication Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust automotive integrated circuits
Proceedings paper2017-07, 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits - EMCCompo, 4/07/2017, p.141-145Publication Machine learning based error detection in transient susceptibility tests
Journal article2019-04, IEEE Transactions on Electromagnetic Compatibility, (61) 2, p.352-360Publication Modeling of contact bounce in a transient electromagnetic compatibility test for the analysis and optimization of nonlinear devices
Journal article2017, IEEE Transactions on Electromagnetic Compatibility, (59) 2, p.541-544Publication Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test
Proceedings paper2017-09, International Symposium on Electromagnetic Compatibility - EMC EUROPE, 4/09/2017, p.1-5