Browsing by Author "Rakhimov, A."
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Publication Effect of VUV and EUV radiation on utra low-k materials damage
;Braginsky, O. ;Kovalev, A. ;Lopaev, D. ;Mankelevich, Y. ;Proshina, O. ;Rakhimova, T.Rakhimov, A.Proceedings paper2013, Advanced Interconnects for Micro- and Nanoelectronics - Materials, Processes, and Reliability, 1/04/2013, p.AA03.11Publication F atoms interaction with nanoporous OSG low-k materials
;Rakhimova, T. ;Rakhimov, A. ;Zyryanov, S. ;Lopaev, D. ;Mankelevich, Y. ;Proshina, O.Novikova, N.Meeting abstract2014, MRS Spring Meeting Symposium CC: New Materials and Processes for Interconnects, Novel Memory and Advanced Display Technologies, 15/03/2014, p.CC1.03-283Publication Interaction of F atoms with SiCOH ultra low-k films. Part I: Fluorination and damage
;Rakhimova, T. ;Lopaev, D. ;Mankelevich, Y. ;Rakhimov, A. ;Zyryanov, S. ;Kurchikov, K.Novikova, N.Journal article2015, Journal of Physics D: Applied Physics, (48) 17, p.175203Publication Low-k films modification under EUV and VUV radiation
;Rakhimova, T. ;Rakhimov, A. ;Mankelevich, Y.A. ;Lopaev, D.V. ;Kovalev, A.S.Vasil'eva, A.N.Journal article2014, Journal of Physics D: Applied Physics, (47) 2, p.25102Publication Modification of OSG based low-k films under EUV and VUV exposure
;Rakhimova, T. ;Rakhimov, A. ;Mankelevich, Y. ;Lopaev, D. ;Kovalev, A. ;Vasil'eva, A.Proshina, O.Journal article2013, Applied Physics Letters, 102, p.111902Publication Ultra low-k dielectrics damage under VUV and EUV radiation
;Zyryanov, S. ;Braginsky, O. ;Kovaev, A. ;Lopaev, D. ;Mankelevich, Y. ;Rakhimova, T.Rakhimov, A.Meeting abstract2012, 65th Gaseous Electronics Conference, 22/10/2012, p.CT2.00005