Browsing by Author "Rathi, Aarti"
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Publication Charge Trapping and Emission during Bias Temperature Stressing of Schottky Gate GaN-on-Silicon HEMT Structures Targeting RF/mm Wave Power Amplifiers
; ; ;Alian, Alireza; ; Journal article2024, MICROMACHINES, (15) 8, p.Art. 951Publication Cryogenic temperature DC-IV measurements and compact modeling of n-channel bulk FinFETs with 3-4 nm wide fins and 20 nm gate length for quantum computing applications
Journal article2021, SOLID-STATE ELECTRONICS, 185, p.108089Publication DC Reliability study of high-k GaN-on-Si MOS-HEMT's for mm-Wave Power Amplifiers
Proceedings paper2024, International Reliability Physics Symposium (IRPS), 2024-04-14Publication Dynamic ON-State Breakdown of GaN-on-Si HEMT
; ; ; ;Chong, Y. ;Wu, T.-L.; Proceedings paper2026, IEEE International Reliability Physics Symposium (IRPS), 2026-03-22, p.1-8Publication Evolution of GaN HEMT Small-Signal parameters during semi-on state for RF/mm-wave applications
Proceedings paper2025, IEEE International Reliability Physics Symposium (IRPS), 2025-03-30Publication Junction-engineered Scaled High-performance GAA Nanosheet FETs with Ultra-low Temperature (< 350 °C) SiGe:B Source/Drain
Proceedings paper2025, EEE International Electron Devices Meeting (IEDM), 2025-12-06Publication Load Pull Driven Insights for GaN on Si Technology Optimisation at FR3/FR2
Proceedings paper2025, Asia-Pacific Microwave Conference (APMC), 2025-12-02, p.1-3Publication Perspectives on GaN MISHEMT Power Amplifier versus Positive Gate Bias Instability
Proceedings paper2025, IEEE International Reliability Physics Symposium (IRPS), 2025-03-30Publication Reverse Gate Leakage Induced Buffer Charging and Threshold Voltage Shift of GaN HEMTs
; ; ; ; ; ;Alian, AlirezaWu, Tian-LIJournal article2024, IEEE TRANSACTIONS ON ELECTRON DEVICES, (71) 12, p.7308-7313Publication Threshold Voltage Bias Temperature Instability of RF MIS-HEMTs and Schottky HEMTs Under Semi-On State Stress
Journal article2025, IEEE TRANSACTIONS ON ELECTRON DEVICES, (72) 10, p.5359-5365Publication Toward Understanding Stability of RF MIS-HEMTs under ON/SEMI-ON/OFF-State Pulses with Scaling in-situ SiN Thicknesses
Proceedings paper2025, IEEE International Reliability Physics Symposium (IRPS), 2025-03-30Publication Understanding Gate Breakdown Mechanisms in RF GaN MIS-HEMTs with thin gate SiN
Proceedings paper2026, IEEE International Reliability Physics Symposium (IRPS), 2026-03-22, p.1-6