Browsing by Author "Rathi, Aarti"
Now showing 1 - 3 of 3
- Results per page
- Sort Options
Publication Charge Trapping and Emission during Bias Temperature Stressing of Schottky Gate GaN-on-Silicon HEMT Structures Targeting RF/mm Wave Power Amplifiers
; ; ; ; Journal article2024, MICROMACHINES, (15) 8, p.Art. 951Publication Cryogenic temperature DC-IV measurements and compact modeling of n-channel bulk FinFETs with 3-4 nm wide fins and 20 nm gate length for quantum computing applications
Journal article2021, SOLID-STATE ELECTRONICS, 185, p.108089Publication Reverse Gate Leakage Induced Buffer Charging and Threshold Voltage Shift of GaN HEMTs
; ; ; ; ;