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Browsing by Author "Rathi, Aarti"

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    Charge Trapping and Emission during Bias Temperature Stressing of Schottky Gate GaN-on-Silicon HEMT Structures Targeting RF/mm Wave Power Amplifiers

    O'Sullivan, Barry  
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    Rathi, Aarti  
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    Alian, Alireza
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    Yadav, Sachin  
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    Yu, Hao  
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    Sibaja-Hernandez, Arturo  
    Journal article
    2024, MICROMACHINES, (15) 8, p.Art. 951
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    Cryogenic temperature DC-IV measurements and compact modeling of n-channel bulk FinFETs with 3-4 nm wide fins and 20 nm gate length for quantum computing applications

    Gupta, Sumreti
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    Rathi, Aarti
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    Parvais, Bertrand  
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    Dixit, Abhisek
    Journal article
    2021, SOLID-STATE ELECTRONICS, 185, p.108089
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    DC Reliability study of high-k GaN-on-Si MOS-HEMT's for mm-Wave Power Amplifiers

    O'Sullivan, Barry  
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    Alian, AliReza  
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    Sibaja-Hernandez, Arturo  
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    Franco, Jacopo  
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    Yadav, Sachin  
    Proceedings paper
    2024, International Reliability Physics Symposium (IRPS), 2024-04-14
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    Evolution of GaN HEMT Small-Signal parameters during semi-on state for RF/mm-wave applications

    Rathi, Aarti  
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    O'Sullivan, Barry  
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    ElKashlan, Rana  
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    Kazemi Esfeh, Babak  
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    Sibaja-Hernandez, Arturo  
    Proceedings paper
    2025, IEEE International Reliability Physics Symposium (IRPS), 2025-03-30
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    Evolution of GaN HEMT Small-Signal parameters during semi-on state for RF/mm-wave applications

    Rathi, Aarti  
    ;
    O'Sullivan, Barry  
    ;
    ElKashlan, Rana  
    ;
    Kazemi Esfeh, Babak  
    ;
    Sibaja-Hernandez, Arturo  
    Proceedings paper
    2025, IEEE International Reliability Physics Symposium (IRPS), 2025-03-30
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    Perspectives on GaN MISHEMT Power Amplifier versus Positive Gate Bias Instability

    Yu, Hao  
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    ElKashlan, Rana  
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    Tsai, M. -C.
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    Yang, Y.
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    Guenach, M.
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    Kuo, Ying-Chun  
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    Yadav, Sachin  
    Proceedings paper
    2025, IEEE International Reliability Physics Symposium (IRPS), 2025-03-30
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    Reverse Gate Leakage Induced Buffer Charging and Threshold Voltage Shift of GaN HEMTs

    Yu, Hao  
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    Yadav, Sachin  
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    O'Sullivan, Barry  
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    Lin, Tzu-Heng  
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    Rathi, Aarti  
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    Alian, Alireza
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    Wu, Tian-LI
    Journal article
    2024, IEEE TRANSACTIONS ON ELECTRON DEVICES, (71) 12, p.7308-7313
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    Toward Understanding Stability of RF MIS-HEMTs under ON/SEMI-ON/OFF-State Pulses with Scaling in-situ SiN Thicknesses

    Yang, Yi
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    Yu, Hao  
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    Tsai, Meng-Che
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    Lin, Wei-Tung
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    Kuo, Ying-Chu
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    O'Sullivan, Barry  
    ;
    Rathi, Aarti  
    Proceedings paper
    2025, IEEE International Reliability Physics Symposium (IRPS), 2025-03-30

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