Browsing by Author "Rodrigues, Michele"
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Publication Analysis of the interface trap density in SOI FinFETs with different TiN gate electrode thickness through charge pumping technique
Proceedings paper2009-09, 24th Symposium on Microelectronics Technology and Devices - SBMicro, 31/08/2009, p.559-565Publication Channel backscattering coefficient impact on FinFET devices with uniaxial/biaxial strain engineering
Proceedings paper2010, 11th International Conference on Ultimate Integration on Silicon - ULIS, 18/03/2010, p.17-20Publication Impact of TiN metal gate thickness and the HfSiO nitridation on MuGFETs electrical performance
Proceedings paper2009, 10th International Conference on Ultimate Integration of Silicon - ULIS, 18/03/2009, p.189-192Publication Impact of the TiN layer thickness on the low-frequency noise and static device performance of n-channel MuGFETs
Proceedings paper2009, 20th International Conference on Noise and Fluctuations - ICNF, 14/06/2009, p.167-170Publication Impact of the TiN metal gate thickness on gate induced floating body effect
Proceedings paper2009, 5th EUROSOI Workshop, 19/01/2009, p.131-132Publication Low frequency noise performance of state-of-the-art and emerging CMOS devices
Proceedings paper2012, Dielectrics for Nanosystems 5: Materials Science, Processing, Reliability, and Manufacturing -and- Tutorials in Nanotechnology, 6/05/2012, p.567-580