Browsing by Author "Sawada, Masanori"
- Results Per Page
- Sort Options
Publication Calibrated wafer-level HBM measurements for quasi-static and transient device analysis
Proceedings paper2007, EOS/ESD Symposium Proceedings, 16/09/2007, p.89-94Publication Calibration and modeling of LICCDM setups
Meeting abstract2021, International Electrostatic Discharge Workshop - IEW, 15/05/2021Publication Calibration of very fast TLP transients
Proceedings paper2009-09, 31st Annual EOS/ESD Symposium, 30/08/2009, p.2B.4Publication CDM ESD testing of a 3D TSV stacked IC chip
Meeting abstract2014-10, 5th IEEE International 3D-TEST Workshop, 23/10/2014, p.1-4Publication CDM protection of a 3D TSV memory IC with a 100 GB/s Wide I/O data bus
Proceedings paper2014-09, EOS/ESD Symposium Proceedings, 7/09/2014, p.61-67Publication Comparison of system-level ESD design methodologies – towards the efficient and ESD robust design of systems
Journal article2013, IEEE Transactions on Device and Materials Reliability, (13) 1, p.213-222Publication ESD on-wafer characterization: Is TLP still the right measurement tool?
Journal article2009-10, IEEE Transactions on Instrumentation and Measurement, (58) 10, p.3418-3426Publication Evaluation of co-design methodologies for ESD robust system design
Proceedings paper2014-10, RCJ EOS/ESD/EMC Symposium, 29/10/2014, p.37-42Publication Faster ESD device characterization with wafer-level HBM
Proceedings paper2007, 20th IEEE International Conference on Microelectronic Test Structures - ICMTS, 19/03/2007, p.93-96Publication FI-CDM and LICCDM testing on wafer, single die and package levels
Proceedings paper2024, 46th Annual Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), SEP 16-18, 2024Publication HBM parameter extraction and transient safe operating area
Proceedings paper2010-10, 32nd Annual EOS/ESD Symposium, 3/10/2010, p.425-432Publication Impact of tester source impedance on HBM failure level
; ; ; Publication Improved calibration method for VFTLP transients
Oral presentation2011, 5th Annual International ESD Workshop - IEWPublication Low-impedance Contact CDM – Evaluation and Modeling
Proceedings paper2019, 2019 41st Annual EOS/ESD Symposium (EOS/ESD), 15/09/2019Publication Miscorrelation between IEC61000-4-2 type of HMM tester and 50 $X HMM tester
Proceedings paper2012, EOS/ESD Symposium, 9/09/2012Publication Mixed-mode simulations for power-on ESD analysis
; ; ; Sawada, MasanoriProceedings paper2012, EOS/ESD Symposium, 9/09/2012Publication Mixed-mode simulations for power-on ESD analysis
Proceedings paper2012-10, RCJ Symposium, 30/10/2012Publication On-wafer human metal model – system-level ESD stress on component level
Proceedings paper2008-10, RCJ ESD Symposium, 30/10/2008Publication On-wafer human metal model measurements for system-level ESD analysis
Meeting abstract2009-09, 31st Annual EOS/ESD Symposium, 30/08/2009, p.5B.4Publication On-wafer human metal model measurements for system-level ESD analysis on component level
Proceedings paper2009-10, RCJ ESD Symposium, 20/10/2009