Browsing by Author "Scholz, Mirko"
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Publication A 4.5 kV HBM, 300 V CDM, 1.2 kV HMM ESD protected DC-to-16.1 GHz wideband LNA in 90 nm CMOS
Proceedings paper2009, 31st Annual EOS/ESD Symposium, 30/08/2009, p.5A.6Publication A novel method for guard ring efficiency assessment and its application for esd protection design and optimization
Publication A plug-and-play wideband RF circuit ESD protection methodology: T-diodes
Journal article2009, Microelectronics Reliability, (49) 12, p.1440-1446Publication A silicon-controlled rectifier-based ESD protection for MEMS – Merits and challenges
Proceedings paper2011, 33rd Annual EOS/ESD Symposium, 11/09/2011Publication A study of breakdown mechanisms in electrostatic actuators using mechanical response under EOS-ESD stress
Proceedings paper2009, 31st Annual EOS/ESD Symposium, 30/08/2009, p.3B.5Publication Active-lite interposer for 2.5 & 3D integration
Proceedings paper2015, IEEE Symposium on VLSI Technology, 16/06/2015, p.T222-T223Publication An insight into the parasitic capacitances of SOI and bulk FinFET devices
Proceedings paper2009, 18th European Workshop on Heterostructure Technology - HETECH, 2/11/2009Publication An integrated measurement set-up to study the impact of atmosphere on ESD in MEMS
Oral presentation2010, International ESD Workshop - IEWPublication Analysis of high voltage ESD protection devices under HBM ESD stress
Proceedings paper2008-05, 2nd International ESD Workshop - IEW, 12/05/2008Publication Behavior of RF MEMS switches under ESD stress
Proceedings paper2010, 32nd Annual EOS/ESD Symposium, 3/10/2010, p.443-449Publication Bidirectional NPN ESD protection in silicon photonics technology
; ; ; Meeting abstract2016, International Reliability Physics Symposium - IRPS, 17/04/2016, p.1-7Publication Calibrated wafer-level HBM measurements for quasi-static and transient device analysis
Proceedings paper2007, EOS/ESD Symposium Proceedings, 16/09/2007, p.89-94Publication Calibration of very fast TLP transients
Proceedings paper2009, RCJ ( Reliability Center for electronic components of Japan ) Symposium, 22/10/2009, p.63-68Publication Calibration of very fast TLP transients
Proceedings paper2009-09, 31st Annual EOS/ESD Symposium, 30/08/2009, p.2B.4Publication CDM and HBM analysis of ESD protected 60 GHz power amplifier in 45 nm low-power digital CMOS
Proceedings paper2009, 31st Annual EOS/ESD Symposium, 30/08/2009, p.5A.3Publication CDM ESD testing of a 3D TSV stacked IC chip
Meeting abstract2014-10, 5th IEEE International 3D-TEST Workshop, 23/10/2014, p.1-4Publication CDM protection of a 3D TSV memory IC with a 100 GB/s Wide I/O data bus
Proceedings paper2014-09, EOS/ESD Symposium Proceedings, 7/09/2014, p.61-67Publication Center balanced distributed ESD protection for 1-110 GHz distributed amplifier in 45 nm CMOS technology
Proceedings paper2009, 31st Annual EOS/ESD Symposium, 30/08/2009, p.5A.9Publication Challenges and solutions for ESD protection in advanced logic and RF CMOS technologies
Proceedings paper2008, 2nd International ESD Workshop - IEW, 12/05/2008Publication Challenges for ESD solutions in germanium-based technologies
Meeting abstract2016, International ESD Workshop - IEW, 16/05/2016, p.C4