Browsing by Author "Tempel, Georg"
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Publication Analysis of silicide / diffusion contact resistance making use of transmission line stuctures
Proceedings paper2002, Silicon Materials - Processing, Characterization, and Reliability, 1/04/2002, p.53-58Publication Analytical model for failure rate prediction due to anomalous charge loss of Flash memories
Proceedings paper2001, IEDM Technical Digest, 2/12/2001, p.699-702Publication Analytical percolation model for predicting anomalous charge loss in flash memories
Journal article2004, IEEE Trans. Electron Devices, (51) 9, p.1392-1400Publication Co-silicide, Co(Ni)-silicide and Ni-silicide to source/drain contact resistance
Proceedings paper2003, Advanced Short-Time Thermal Processing for Si-based CMOS devices, 27/04/2003, p.197-204Publication Development of sub-10-nm atomic layer deposition barriers for Cu/low-k interconnects
Journal article2002, Microelectronic Engineering, (64) 1_4, p.233-245Publication Electrical activity of B and As segregated at the Si-SiO2 interface
Proceedings paper2002, Silicon Front-End Junction Formation Technologies, 1/04/2002, p.C3.4Publication Failure rate prediction and accelerated detection of anomalous charge loss in flash memories by using an analytical transient physics-based charge loss model
Journal article2002, Japanese Journal of Applied Physics. Part 1, (41) 4B, p.2650-2653Publication Statistical model for SILC and pre-breakdown current jumps in ultra-thin oxide layers
Proceedings paper2001, IEDM Technical Digest, 2/12/2001, p.121-4Publication Time dependent anomalous charge loss modeling in flash memories and an accelerated testing procedure
Proceedings paper2001, Extended Abstracts of the 2001 International Conference on Solid State Devices and Materials - SSDM, p.536-537