Browsing by Author "Thoan, N.H."
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Publication Atomic and electrical characterisation of amorphous silicon passivation layers
Proceedings paper2012, Proceedings of the 2nd International Conference on Crystalline Silicon Photovoltaics - Silicon PV, 3/04/2012, p.185-190Publication Charge instability of atomic-layer deposited TaSiOx insulators on Si, InP, and In0.53Ga0.47As
Journal article2012, Applied Physics Letters, (100) 20, p.202104Publication Impact of strain on the passivation efficiency of Ge dangling bond interface defects in condensation grown SiO2/GeSi1-x/SiO2/(100)Si structures with nm-thin GexSi1-x layers
Journal article2014, Applied Surface Science, 291, p.11-15Publication Internal photoemission at interfaces of ALD TaiOx insulating layers deposited on Si, InP and In0.53Ga0.47As
Proceedings paper2012, E-MRS Spring Meeting Symposium M: More than Moore: Novel Materials Approaches for Functionalized Silicon Based Microelectronics, 14/05/2012, p.12019