Browsing by Author "Vanhellemont, Jan"

A low-frequency noise study of state-of-the-art silicon n+p junction diodes

A simple technique for the separation of bulk and surface recombination parameters in silicon

A Study on the Microscopical and Macroscopical Effects of Hydrogenation on the Performance of Multicrystalline Solar Cells

Analysis of irradiation induced defects in silicon devices

Analytical electron microscopy of Si1-xGex/Si heterostructures and local isolation structures

Analytical Electron Microscopy of Si1-xGex/Si Heterostructures and Local Isolation Structures

Assessment of quantitative characterization of localized strain using electron diffraction contrast imaging

Brother silicon, sister germanium

Bulk defect induced low-frequency noise in n+-p silicon diodes

Carrier lifetime spectrocopy for defect characterization in semiconductor materials and devices

Characterisation of high-energy proton irradiation induced recombination centers in silicon

Characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy

Characterization of SIPOS films by spectroscopic ellipsometry and transmission electron microscopy

Characterization of strain in an advanced semiconductor laser structure with nanometer range resolution using a new algorithm for electron diffraction contrast imaging interpretation

Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM

Correlation between grown-in silicon substrate defects and silicon gate oxide breakdown characteristics

Creation and dissolution of oxygen related defects in czochralski grown silicon at high pressure - high temperatures

Creation and dissolution of oxygen related defects in czochralski grown silicon treated at high pressures - high temperatures

Deep levels in heat-treated and 252Cf-irradiated P-type silicon substrates with different oxygen content

Deep-level transient spectroscopic study of quenched-in defects in germanium