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Browsing by Author "Verheijen, M.A."

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    Advanced PMOS device architecture for highly-doped ultra-shallow junctions

    Surdeanu, Radu
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    Pawlak, Bartek  
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    Lindsay, Richard
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    Van Dal, Mark  
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    Doornbos, Gerben  
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    Dachs, C.J.J.
    Journal article
    2004, Japanese J. of Appl. Phys. Part 1, (43) 4B, p.1778-1783
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    Characterization of thermal and electrical stability of MOCVD HfO2-HfSiO4 dielectric layers with polysilicon electrodes for advanced CMOS technologies

    Rittersma, Chris
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    Loo, Josine
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    Ponomarev, Youri
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    Verheijen, M.A.
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    Kaiser, M.
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    Roozeboom, F.
    Journal article
    2004, Journal of the Electrochemical Society, (151) 12, p.G870-G877
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    Evidence of the thermo-electric Thomson effect and influence on the program conditions and cell optimization in phase-change memory cells

    Tio Castro, David
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    Goux, Ludovic  
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    Hurkx, G.A.M.
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    Attenborough, Karen
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    Delhougne, Romain  
    Proceedings paper
    2007, Technical Digest International Electron Devices Meeting - IEDM, 10/12/2007, p.315-318
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    Laser annealing for ultra-shallow junction formation in advanced CMOS

    Surdeanu, Radu
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    Ponomarev, Youri
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    Cerutti, R.
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    Pawlak, Bartek  
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    Nanver, L.K.
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    Hoflijk, Ilse  
    Proceedings paper
    2002, Rapid Thermal And Other Short-Time Processing Technologies III, 12/05/2002, p.413-426
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    Quantitative prediction of junction leakage in bulk-technology CMOS devices

    Duffy, R.
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    Heringa, A.
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    Venezia, V.C.
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    Loo, Josine
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    Verheijen, M.A.
    ;
    Hopstaken, M.J.P.
    Journal article
    2010, Solid-State Electronics, (54) 3, p.243-251

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