Browsing by Author "Vinicius de Oliveira, Alberto"
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Publication Comparative analysis of the intrinsic voltage gain and unit gain frequency between SOI and bulk FinFETs up to high temperatures
Journal article2016, Solid-State Electronics, 123, p.124-129Publication Effective hole mobility and low-frequency noise characterization of strained Ge pFinFETs
Proceedings paper2016, Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - ULIS, 25/01/2016Publication Impact of gate stack layer composition on dynamic threshold voltage and analog parameters of Ge pMOSFETs
Journal article2016, Journal of Integrated Circuits and Systems, (11) 1, p.7-12Publication Impact of the low temperature operation on long channel strained Ge pFinFETs fabricated with STI first and last processes
Proceedings paper2016, 2016 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 10/10/2016, p.1-3Publication Low frequency noise and fin width study of Si passivated Ge pFinFETs
Proceedings paper2016, China Semiconductor Technology International Conference - CSTIC Symposium I: Device Engineering and Technology, 13/03/2016