Browsing by Author "Wagner, Paul-Jurgen"
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Publication A rigorous study of measurement techniques for negative bias temperature instability
Proceedings paper2007-10, IEEE International Integrated Reliability Workshop Final Report - IIRW, 15/10/2007, p.6-11Publication Analytic modeling of the bias temperature instability using capture/emission time maps
Publication On the frequency dependence of the bias temperature instability
Proceedings paper2012, IEEE International Reliability Physics Symposium - IRPS, 15/04/2012, p.XT.8.1-XT.8.7Publication Oxide traps in MOS transistors: semi-automatic extraction of trap parameters from time dependent defect spectroscopy
Proceedings paper2010-07, 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA, 5/07/2010Publication Recent advances in understanding the bias temperature instability
Proceedings paper2010-12, IEEE International Electron Devices Meeting - IEDM, 6/12/2010Publication Switching oxide traps as the missing link between negative bias temperature instability and random telegraph noise
Publication The "permanent" component of NBTI: composition and annealing
Publication The paradigm shift in understanding the bias temperature instability: from reaction–diffusion to switching oxide traps
Journal article2011, IEEE Transactions on Electron Devices, (58) 11, p.3652-3666Publication The time dependent defect spectroscopy (TDDS) for the characterization of the bias temperature instability
Publication Time-dependent defect spectroscopy for characterization of border traps in metal-oxide-semiconductor transistors
Journal article2010-12, Physical Review B, (82) 24, p.245318