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Browsing by Author "Werner, Thilo"

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    28nm pitch of line/space pattern transfer into silicon substrates with chemo-epitaxy directed self-assembly (DSA) process flow

    Chan, BT  
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    Tahara, Shigeru
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    Parnell, Doni
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    Rincon Delgadillo, Paulina  
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    Gronheid, Roel  
    Oral presentation
    2013, 39th International Conference on Micro and Nano Engineering - MNE
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    Conversion of synchronous artificial neural network to asynchronous spiking neural network using sigma-delta quantization

    Yousefzadeh, A.
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    Hosseini, S.
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    Holanda, P.
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    Leroux, Sam  
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    Werner, Thilo
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    Serrano-Gotarredona, T.
    Proceedings paper
    2019, AICAS2019, the 1st IEEE International Conference on Artificial Intelligence Circuits and Systems, 18/03/2019, p.81-85
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    Diamond tips for automated electrical probing inside a scanning electron microscopy system

    Hantschel, Thomas  
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    Arstila, Kai
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    Olantera, Lauri
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    Schulze, Andreas
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    Werner, Thilo
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    Eyben, Pierre  
    Journal article
    2011, Diamond and Related Materials, (20) 5_6, p.655-659
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    Overcoated diamond tips for nanometer-scale semiconductor device characterization

    Hantschel, Thomas  
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    Tsigkourakos, Menelaos
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    Kluge, Julia
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    Werner, Thilo
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    Zha, Lichen  
    Journal article
    2015, Microelectronic Engineering, 141, p.1-5
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    Overcoated diamond tips for nanometer-scale semiconductor device characterization

    Hantschel, Thomas  
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    Tsigkourakos, Menelaos
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    Kluge, Julia
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    Werner, Thilo
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    Zha, Lichen  
    Proceedings paper
    2014-09, Micro and Nano Engineering Conference - MNE, 22/09/2014
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    Studying local aluminum back surface fields (AL-BSF) contacts through scanning spreading resistance microscopy (SSRM)

    Uruena De Castro, Angel
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    John, Joachim  
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    Eyben, Pierre  
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    Vanhaeren, Danielle  
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    Werner, Thilo
    Proceedings paper
    2011, 26th European Photovoltaic Solar Energy Conference - EU PVSEC, 5/09/2011, p.1530-1533
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    TiN scanning probes for electrical profiling of nanoelectronics device structures

    Hantschel, Thomas  
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    Schulze, Andreas
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    Celano, Umberto  
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    Moussa, Alain  
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    Arstila, Kai
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    Eyben, Pierre  
    Journal article
    2012, Microelectronic Engineering, 97, p.255-258
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    TiN scanning probes for electrical profiling of nanoelectronics device structures

    Hantschel, Thomas  
    ;
    Schulze, Andreas
    ;
    Celano, Umberto  
    ;
    Moussa, Alain  
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    Arstila, Kai
    ;
    Eyben, Pierre  
    Oral presentation
    2011, Micro- and Nanoengineering Conference - MNE
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    Two-dimensional analysis of Al and B back surface field using scanning

    Eyben, Pierre  
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    Werner, Thilo
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    Hantschel, Thomas  
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    Schulze, Andreas
    ;
    Lorenz, Anne
    ;
    John, Joachim  
    Proceedings paper
    2011, 2nd Intl Workshop for SPM for Energy Applications, 8/06/2011

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