Repository logo Institutional repository
  • Communities & Collections
  • Browse
  • Site
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "Yang, N."

Filter results by typing the first few letters
Now showing 1 - 5 of 5
  • Results Per Page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    A comparative study of gate direct tunneling and drain leakage currents in N-MOSFET's with sub-2-nm gate oxides

    Yang, N.
    ;
    Henson, W. K.
    ;
    Wortman, J. J.
    Journal article
    2000, IEEE Trans. Electron Devices, (47) 8, p.1636-1644
  • Loading...
    Thumbnail Image
    Publication

    Analysis of leakage currents and impact on off-state power consumption for CMOS technology in the 100-nm regime

    Henson, Kirklen
    ;
    Yang, N.
    ;
    Kubicek, Stefan  
    ;
    Vogel, E. M.
    ;
    Wortman, J.
    ;
    De Meyer, Kristin  
    Journal article
    2000, IEEE Trans. Electron Devices, (47) 7, p.1393-1400
  • Loading...
    Thumbnail Image
    Publication

    Analysis of tunneling currents and reliability of NMOSFET's with sub-2 nm gate oxides

    Yang, N.
    ;
    Henson, W. K.
    ;
    Wortman, J. J.
    Proceedings paper
    1999, International Electron Devices Meeting. Technical digest; December 1999; Washington, D.C., p.453-456
  • Loading...
    Thumbnail Image
    Publication

    Diamond nano-wires, a new approach towards next generation electrochemical gene sensor platforms

    Nebel, C.E.
    ;
    Yang, N.
    ;
    Uetsuka, H.
    ;
    Osawa, E.
    ;
    Tokuda, N.
    ;
    Williams, O.
    Journal article
    2009, Diamond and Related Materials, (18) 5_8, p.910-917
  • Loading...
    Thumbnail Image
    Publication

    Observation of oxide breakdown and its effects on the characteristics of ultra-thin-oxide nMOSFETs

    Henson, W. K.
    ;
    Yang, N.
    ;
    Wortman, J. J.
    Journal article
    1999, IEEE Electron Device Letters, (20) 12, p.605-607

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings