Browsing by Author "Zhang, W.D."

A novel trapping/detrapping model for defect profiling in high-k materials using the two-pulse capacitance-voltage technique

Effects of detrapping on electron traps generated in gate oxides

Electron trap generation at different temperatures in the gate oxide

Electron trapping in HfAI0 high-k stack for Flash memory applications: an origin of Vth window closure during cyclling operations

Energy and spatial distributions of electron traps throughout Sio2/Al2O3 stacks as the IPD in flash memory application

Energy distribution of positive charges in high-k dielectric

Impact of PDA temperature on electron trap energy and spatial distributions in SiO2/Al2O3 stack as the IPD in Flash memory cells

Statistical characterization of vertical poly-Si channel using charge pumping technique for 3D flash memory optimization

Statistical characterization of vertical poly-Si channel using charge pumping technique for 3D flash memory optimization

Two types of electron traps generated in the gate silicon dioxide

Two-pulse C-V: a new method for characterization electron traps in the bulk of SiO2/high-k dielectric stacks

Which defect breaks down gate oxides?