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Browsing by Author "Zhao, Ying"

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    A Physical TCAD Mobility Model of Amorphous In-Ga-Zn-O (a-IGZO) Devices with Spatially Varying Mobility Edges, Band-Tails, and Enhanced Low-Temperature Convergence

    Thesberg, Mischa
    ;
    Schanovsky, Franz
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    Zhao, Ying  
    ;
    Karner, Markus
    ;
    Gonzalez-Medina, Jose Maria
    Journal article
    2024, MICROMACHINES, (15) 7, p.Art. 829
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    Efficient convolutional auto-encoding via random convexification and frequency-domain minimization

    Oveneke, Meshia
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    Aliosha-Perez, Mitchel
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    Zhao, Ying
    ;
    Jiang, Dongmei
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    Sahli, Hichem  
    Meeting abstract
    2016, International Workshop on Efficient Methods for Deep Neural Networks - NIPS, 9/12/2016
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    Fundamental understanding of NBTI degradation mechanism in IGZO channel devices

    Zhao, Ying  
    ;
    Rinaudo, Pietro  
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    Vaisman Chasin, Adrian  
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    Truijen, Brecht  
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    Kaczer, Ben  
    Proceedings paper
    2024, International Reliability Physics Symposium (IRPS), APR 14-18, 2024
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    Gate oxide reliability: upcoming trends, challenges, and opportunities

    Kaczer, Ben  
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    Degraeve, Robin  
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    Franco, Jacopo  
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    Grasser, T.
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    Roussel, Philippe  
    ;
    Bury, Erik  
    Proceedings paper
    2024, IEEE Silicon Nanoelectronics Workshop (SNW) / Symposium on VLSI Technology and Circuits, 2024-06-15, p.3-4
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    Light-assisted investigation of the role of oxygen flow during IGZO deposition on deep subgap states and their evolution under PBTI

    Rinaudo, Pietro  
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    Vaisman Chasin, Adrian  
    ;
    Zhao, Ying  
    ;
    Kaczer, Ben  
    ;
    Rassoul, Nouredine  
    Proceedings paper
    2024, International Reliability Physics Symposium (IRPS), APR 14-18, 2024
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    Subthreshold swing behavior in amorphous indium-gallium-zinc-oxide transistors from room to cryogenic temperatures

    Tang, Hongwei  
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    Belmonte, Attilio  
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    Lin, Dennis  
    ;
    Zhao, Ying  
    ;
    Beckers, Arnout  
    ;
    Verdonck, Patrick  
    Journal article
    2025-JUN 9, APPLIED PHYSICS LETTERS, (126) 23, p.232108-1-232108-6

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