Browsing by author "Privitera, Vittorio"
Now showing items 1-12 of 12
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Advanced characterization of carrier profiles in germanium using micro-machined contact probes
Clarysse, Trudo; Konttinen, Mikko; Parmentier, Brigitte; Moussa, Alain; Vandervorst, Wilfried; Impellizzeri, Giuliana; Napolitani, Enrico; Privitera, Vittorio; Nielsen, Peter F.; Petersen, Dirch H.; Hansen, Ole (2012) -
Aluminium implantation in germanium: uphill diffusion, electrical activation and trapping
Impellizzeri, Giuliana; Napolitani, Enrico; Boninelli, Simona; Privitera, Vittorio; Clarysse, Trudo; Vandervorst, Wilfried; Priolo, Francesco (2012) -
Carrier Distribution in Silicon Devices by Atomic Force Microscopy on Etched Surfaces
Raineri, Vito; Privitera, Vittorio; Vandervorst, Wilfried; Hellemans, L.; Snauwaerts, Jan (1994) -
DLTS and PL studies of proton radiation defects in TiN-doped FZ silicon
Simoen, Eddy; Claeys, Cor; Privitera, Vittorio; Coffa, S.; Kokkoris, M.; Kossionides, E.; Fanourakis, G.; Larsen, A. N.; Clauws, P. (2002) -
DLTS PL studies of proton radiation defects in tin-doped FZ silicon
Simoen, Eddy; Claeys, C.; Privitera, Vittorio; Coffa, S.; Kokkoris, M.; Kossionides, E.; Fanourakis, G.; Nylandsted Larsen, A.; Clauws., P. (2001) -
High-energy proton radiation induced defects in tin-doped N- tType sSilicon
Simoen, Eddy; Claeys, C.; Privitera, Vittorio; Coffa, S.; Larsen, A. N.; Clauws, P. (2001) -
On the Determination of Two-Dimensional Carrier Distributions
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Privitera, Vittorio; Raineri, Vito; Hellemans, L.; Snauwaerts, Jan (1994) -
On the determination of two-dimensional carrier distributions
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Hellemans, L.; Snauwaert, J.; Privitera, Vittorio; Raineri, Vito (1995) -
On the determination of two-dimensional carrier distributions
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Hellemans, L.; Snauwaert, J.; Privitera, Vittorio; Raineri, Vito (1995) -
Photoluminescence and deep-level transient spectroscopy study of tin related radiation defects in silicon
Simoen, Eddy; Claeys, Cor; Privitera, Vittorio; Coffa, S.; Nylandsted Larsen, A.; Clauws, P. (2001) -
Two-dimensional spreading resistance profiling: recent understandings and applications
Vandervorst, Wilfried; Privitera, Vittorio; Raineri, Vito; Clarysse, Trudo; Pawlik, M. (1994) -
Verification of 2D SRP by the Analysis of Known Lateral Profiles
Vandervorst, Wilfried; Clarysse, Trudo; Caymax, Matty; Privitera, Vittorio (1995)