Browsing by author "Richter, H."
Now showing items 1-11 of 11
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Grown-in defect density spectra in czochralski silicon wafers
Kissinger, G.; Gräf, D.; Lambert, U.; Vanhellemont, Jan; Richter, H. (1996) -
Infrared studies of oxygen precipitation related defects in silicon after various thermal treatments
Vanhellemont, Jan; Kissinger, G.; Clauws, P.; Kaniava, Arvydas; Libezny, Milan; Gaubas, Eugenijus; Simoen, Eddy; Richter, H.; Claeys, Cor (1996) -
Investigation of crystal defects in As-grown and processed silicon wafers and heteroepitaxial layers by infrared light scattering
Kissinger, G.; Vanhellemont, Jan; Gräf, D.; Zulehner, W.; Claeys, Cor; Richter, H. (1995) -
Investigation of oxygen precipitation related crystal defects in processed silicon wafers by infrared light scattering tomography
Kissinger, G.; Vanhellemont, Jan; Simoen, Eddy; Claeys, Cor; Richter, H. (1996) -
IR-LST a powerful non-invasive tool to observe crystal defects in as-grown silicon, after device processing, and in heteroepitaxial layers
Kissinger, G.; Vanhellemont, Jan; Gräf, D.; Claeys, Cor; Richter, H. (1996) -
Lattice defects in high quality as-grown CZ silicon, studied with light scattering and preferential etching techniques
Vanhellemont, Jan; Kissinger, G.; Gräf, D.; Kenis, Karine; Depas, Michel; Mertens, Paul; Lambert, U.; Heyns, Marc; Claeys, C.; Richter, H.; Wagner, Patrick (1995) -
Light scattering tomography study of lattice defects in high quality as-grown Cz silicon wafers and their evolution during gate oxidation
Vanhellemont, Jan; Kissinger, G.; Gräf, D.; Kenis, Karine; Depas, Michel; Mertens, Paul; Lambert, U.; Heyns, Marc; Claeys, Cor; Richter, H.; Wagner, P. (1996) -
Multichannel optical modules compatible with the fibre in board technology
De Pestel, Geert; Ambrosy, A.; Tan, Q.; Vrana, M.; Migom, F.; Richter, H.; Vandewege, Jan; Vetter, P. (1996) -
Observation of stacking faults and prismatic punching systems in silicon by light scattering tomography
Kissinger, G.; Vanhellemont, Jan; Claeys, Cor; Richter, H. (1996) -
Process modelling
Richter, H.; Mertens, Paul (2002) -
Stresses in strained GeSi stripes: calculation and determination from Raman measurements
Jain, Suresh; Dietrich, B.; Richter, H.; Atkinson, A.; Harker, A. H. (1995)