Browsing by author "Eyben, Pierre"
Now showing items 81-100 of 217
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Electrical tomography using atomic force microscopy and its application towards carbon nanotube-based interconnects
Schulze, Andreas; Hantschel, Thomas; Dathe, Andre; Eyben, Pierre; Ke, Xiaoxing; Vandervorst, Wilfried (2012-07) -
Epitaxial growth in advanced SiGe and Ge MOS devices: challenges and solutions
Loo, Roger; Vincent, Benjamin; Hikavyy, Andriy; Gencarelli, Federica; Eneman, Geert; Witters, Liesbeth; Mitard, Jerome; Hellings, Geert; Sioncke, Sonja; Bender, Hugo; Eyben, Pierre; Caymax, Matty; Vandervorst, Wilfried; Thean, Aaron (2012-09) -
Evaluation of the junction delineation accuracy and reproducibility with the SSRM technique
Eyben, Pierre; Vanhaeren, Danielle; Janssens, Tom; Hantschel, Thomas; Vandervorst, Wilfried; Adachi, Kanna; Ishimaru, Kazunari (2007) -
Evolution of metastable phases in silicon during nanoindentation: mechanism analysis and experimental verification
Mylvaganam, Kausala; Zhang, Liangchi; Eyben, Pierre; Mody, Jay; Vandervorst, Wilfried (2009) -
Experimental studies of dose retention and activation in fin field-effect-transistor-based structures
Mody, Jay; Duffy, Ray; Eyben, Pierre; Goossens, Jozefien; Moussa, Alain; Polspoel, Wouter; Berghmans, Bart; Van Dal, Mark; Pawlak, Bartek; Kaiser, Monja; Weemaes, R. G. R.; Vandervorst, Wilfried (2010) -
Experimental studies of dose retention and activation in FinFet-based structures
Mody, Jay; Duffy, Ray; Eyben, Pierre; Goossens, Jozefien; Moussa, Alain; Polspoel, Wouter; Berghmans, Bart; Van Dal, Mark; Pawlak, Bartek; Kaiser, Monja; Weemaes, Robbert; Vandervorst, Wilfried (2009) -
Extending scanning spreading resistance microscopy towards three-dimensional quantitative carrier mapping in nanowire-based transistors
Schulze, Andreas; Hantschel, Thomas; Eyben, Pierre; Verhulst, Anne; Rooyackers, Rita; Vandooren, Anne; Vandervorst, Wilfried (2012) -
Fabrication of conductive AFM probes and their use in microelectronics
Fouchier, Marc; Alvarez, David; Eyben, Pierre; Duhayon, Natasja; Petry, Jasmine; Drijbooms, Chris (2003) -
Fabrication of conductive atomic force microscope probes and their evaluation for carrier mapping
Fouchier, Marc; Eyben, Pierre; Alvarez, David; Duhayon, Natasja; Xu, Mingwei; Brongersma, Sywert; Lisoni, Judit; Vandervorst, Wilfried (2003-05) -
Fast Fourier transform scanning spreading resistance microscopy: a novel technique to overcome the limitations of classical conductive AFM techniques
Eyben, Pierre; Bisiaux, Pierre; Schulze, Andreas; Nazir, Aftab; Vandervorst, Wilfried (2015) -
Heterostructure at CMOS source/drain: contributor or alleviator to the high access resistance problem?
Yu, Hao; Schaekers, Marc; Rosseel, Erik; Everaert, Jean-Luc; Eyben, Pierre; Chiarella, Thomas; Merckling, Clement; Agarwal Kumar, Tarun; Pourtois, Geoffrey; Hikavyy, Andriy; Kubicek, Stefan; Witters, Liesbeth; Sibaja-Hernandez, Arturo; Mitard, Jerome; Waldron, Niamh; Chew, Soon Aik; Demuynck, Steven; Horiguchi, Naoto; Barla, Kathy; Thean, Aaron; Mocuta, Anda; Mocuta, Dan; Collaert, Nadine; De Meyer, Kristin (2016) -
High resolution dopant/carrier profiling for deep submicron technologies
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Eyben, Pierre; Haegeman, Bart; Xu, Mingwei; Trenkler, Thomas; Hantschel, Thomas; Stephenson, Robert; Conard, Thierry; De Witte, Hilde (1999) -
High resolution electrical characterization of advanced CMOS devices
Eyben, Pierre; Petry, Jasmine; Janssens, Tom; Fukutome, H.; Vandervorst, Wilfried (2004) -
High resolution scanning spreading resistance microscopy of fully depleted silicon-on-insulator devices and double-gate transistors
Alvarez, David; Fouchier, Marc; Hartwich, J.; Eyben, Pierre; Vandervorst, Wilfried (2003) -
High resolution two-dimensional carrier profiling on sub-100nm silicon nano-devices using scanning spreading resistance microscopy
Eyben, Pierre; Fukutome, H.; Alvarez, David; Vandervorst, Wilfried (2004) -
High-resolution scanning spreading resistance microscopy of surrounding-gate transistors
Alvarez, D.; Schömann, S.; Goebel, B.; Manger, D.; Schlösser, T.; Slesazeck, S.; Hartwich, J.; Kretz, J.; Eyben, Pierre; Fouchier, Marc; Vandervorst, Wilfried (2004-01) -
Impact of preferential P-diffusion along the grain boundaries on fine-grained polysilicon solar cells
Carnel, Lodewijk; Gordon, Ivan; Van Gestel, Dries; Vanhaeren, Danielle; Eyben, Pierre; Beaucarne, Guy; Poortmans, Jef (2007) -
Impact of surface preparation on the electrical characteristics of scanning spreading resistance microscopy
Eyben, Pierre; Clarysse, Trudo; Bogdanowicz, Janusz; Janssens, Tom; Mariolle, D.; Bertin, F.; Chabli, A.; Vandervorst, Wilfried (2005) -
Impact of the environmental conditions on the electrical characteristics of scanning spreading resistance microscopy
Eyben, Pierre; Mody, Jay; Vemula, Sri Charan; Vandervorst, Wilfried (2008)