Browsing by author "Moroz, Victor"

A systematic study of trade-offs in engineering a locally strained pMOSFET

Nouri, Faran; Verheyen, Peter; Washington, Lori; Moroz, Victor; De Wolf, Ingrid; Kawaguchi, S.; Biesemans, Serge; Schreutelkamp, Rob; Kim, Y.; Shen, M.; Xu, X.; Rooyackers, Rita; Jurczak, Gosia; Eneman, Geert; De Meyer, Kristin; Smith, L.; Pramanik, D.; Forstner, H.; Thirupapuliyur, S.; Higashi, G. (2004)

An analytical compact model for estimation of stress in multiple through-silicon via configurations

Eneman, Geert; Cho, Jong Hoon; Moroz, Victor; Milojevic, Dragomir; Choi, Munkang; De Meyer, Kristin; Mercha, Abdelkarim; Beyne, Eric; Hoffmann, Thomas Y.; Van der Plas, Geert (2011)

Band-to-band tunneling off-state leakage in Ge fins and nanowires: effect of quantum confinement

Eneman, Geert; Verhulst, Anne; Smith, Lee; Moroz, Victor; De Keersgieter, An; Mocuta, Anda; Collaert, Nadine; Thean, Aaron (2016)

Copper through silicon via induced keep out zone for 10nm node bulk FinFET CMOS technology

Guo, Wei; Moroz, Victor; Van der Plas, Geert; Choi, M.; Redolfi, Augusto; Smith, L.; Eneman, Geert; Van Huylenbroeck, Stefaan; Su, P.D.; Ivankovic, Andrej; De Wachter, Bart; Debusschere, Ingrid; Croes, Kris; De Wolf, Ingrid; Mercha, Abdelkarim; Beyer, Gerald; Swinnen, Bart; Beyne, Eric (2013)

Design Technology Co-Optimization for the DRAM Cell Structure With Contact Resistance Variation

Lee, Jaehyun; Asenov, Plamen; Rhyner, Reto; Kao, Ethan; Amoroso, Salvatore M.; Brown, Andrew R.; Lin, Xi-Wei; Moroz, Victor (2024)

Exploring the limits of stress-enhanced hole mobility

Smith, Lee; Moroz, Victor; Eneman, Geert; Verheyen, Peter; Nouri, Faran; Washington, Lori; Jurczak, Gosia; Penzin, Oleg; Pramanik, Dipu; De Meyer, Kristin (2005-09)

Impact of 3D integration on 7nm high mobility channel devices operating in the ballistic regime

Guo, Wei; Choi, Munkang; Rouhi Najaf Abadi, Alireza; Moroz, Victor; Van der Plas, Geert; Absil, Philippe; Beyne, Eric (2014)

Impact of litho-patterning variations on the electrical performance and variability of advanced interconnects

Ciofi, Ivan; Roussel, Philippe; Baert, Rogier; Kocaay, Deniz; Contino, Antonino; Croes, Kristof; Saad, Yves; Gao, Weimin; Moroz, Victor; Wilson, Chris; Mocuta, Dan; Tokei, Zsolt (2018)

Impact of recessed S/D SiGe integration parameters on device performance

Washington, Lori; Nouri, Faran; Verheyen, Peter; Moroz, Victor; Kawaguchi, Marc; Yihwan, Kim; Samoilov, Arkadiii; Jurczak, Gosia (2005)

Integration of a recessed SiGe Source/Drain into a PMOS transistor

Washington, Lori; Nouri, Faran; Verheyen, Peter; De Wolf, Ingrid; Moroz, Victor; Kawaguchi, Mark; Yihwan, Kim; Samoilov, Arkadii; Jurczak, Gosia (2005)

Layout impact on the performance of a locally strained PMOSFET

Eneman, Geert; Verheyen, Peter; Rooyackers, Rita; Nouri, Faran; Washington, Lori; Degraeve, Robin; Kaczer, Ben; Moroz, Victor; De Keersgieter, An; Schreutelkamp, Rob; Kawaguchi, M.; Kim, Y.; Samoilov, A.; Smith, L.; Absil, Philippe; De Meyer, Kristin; Jurczak, Gosia; Biesemans, Serge (2005)