Browsing by author "Dreesen, R."

A high resolution method for measuring hot carrier degradation in matched transistor pairs

Dreesen, R.; De Ceuninck, Ward; De Schepper, Luc; Groeseneken, Guido (1997)

A high resolution method for measuring hot carrier degradation in matched transistor pairs

Dreesen, R.; De Ceuninck, Ward; De Schepper, Luc; Groeseneken, Guido (1997)

A new degradation model and lifetime extrapolation technique for lightly doped drain NMOSFETs under hot-carrier degradation

Dreesen, R.; Croes, Kris; Manca, Jean; De Ceuninck, Ward; De Schepper, Luc; Pergoot, A.; Groeseneken, Guido (2001)

A new lifetime extrapolation technique for LDD NMOSFETS under hot-carrier degradation

Dreesen, R.; Croes, Kris; Manca, Jean; De Ceuninck, Ward; De Schepper, Luc; Pergoot, A.; Groeseneken, Guido (1999)

Advantage of in-situ over ex-situ techniques as reliability tool: aging kinetics of IMEC's MCM-D discrete passives devices

Soussan, Philippe; Lekens, Geert; Dreesen, R.; De Ceuninck, Ward; Beyne, Eric (2003)

High-resolution SILC measurements of thin SiO2 at ultra low voltages

Aresu, S.; De Ceuninck, Ward; Dreesen, R.; Kroes, K.; Andries, E.; Manca, Jean; De Schepper, Luc; Degraeve, Robin; Kaczer, Ben; D'Olieslaeger, Marc; D'Haen, Jan (2002)

Modelling hot carrier degradation of LDD NMOSFETs by using a high resolution measurement technique

Dreesen, R.; Croes, Kris; Manca, Jean; De Ceuninck, Ward; De Schepper, Luc; Pergoot, A.; Groeseneken, Guido (1999)

Moisture induced failures in flip chip on flex interconnections using anisotropic conductive adhesives

Caers, J.F.J.M.; Zhao, X.J.; Lekens, Geert; Dreesen, R.; Croes, K.; Wong, E.H. (2003)

Statistical aspects of the degradation of LDD nMOSFETs

Andries, E.; Dreesen, R.; Croes, K.; De Ceuninck, Ward; De Schepper, Luc; Groeseneken, Guido; Lo, K.F.; D'Olieslaeger, Marc; D'Haen, Jan (2002)

The use of random effects in modeling non-linear hot-carrier degradation data

Andries, E.; Croes, K.; Dreesen, R.; De Ceuninck, Ward; De Schepper, Luc (2002)