Browsing by author "Wise, Rick"

Defect-free isolation on high-thermal-conductivity SOI substrates for complementary BiCMOS technology

Van Wichelen, Koen; Ong, Patrick; Moussa, Alain; Radisic, Dunja; Devriendt, Katia; Halder, Sandip; Kenis, Karine; Lee, Willie; Vandevelde, Bart; Soonekindt, Christophe; Shahar, Abdul Hadi; Smet, Tom; Van Huylenbroeck, Stefaan; Decoutere, Stefaan; Seacrist, Mike; Ries, Mike; Drobny, Vladimir; Wise, Rick (2009)

Impact of the pre-epi bake conditions in embedded Si1-xGex source/drain junctions

Bargallo Gonzalez, Mireia; Simoen, Eddy; Hikavyy, Andriy; Verheyen, Peter; Loo, Roger; Caymax, Matty; Machkaoutsan, Vladimir; Tomasini, Pierre; Thomas, S.G.; Wise, Rick; Claeys, Cor (2009)

Leakage current study of Si1-xCx embedded source/drain junctions

Simoen, Eddy; Vissouvanadin Soubaretty, Bertrand; Taleb, Nadjib; Bargallo Gonzalez, Mireia; Verheyen, Peter; Loo, Roger; Claeys, Cor; Machkaoutsan, Vladimir; Bauer, Matthias; Thomas, Shawn; Lu, J.-P.; Wise, Rick (2008)

Sandwich stacks replacing SiO2 in standard bonded Si-on-insulator (SOI) substrates to obtain a high-thermal conductivity HTC-SOI substrate

Van Wichelen, Koen; Schaekers, Marc; Decoutere, Stefaan; Seacrist, Mike; Drobny, Vladimir; Wise, Rick (2008)

Strain enhanced nMOS using in-situ doped embedded Si:C S/D stressors with up to 1.5% substitutional carbon content grown using a novel deposition process

Verheyen, Peter; Kerner, Christoph; Clemente, Francesca; Bender, Hugo; Shamiryan, Denis; Loo, Roger; Hoffmann, Thomas Y.; Absil, Philippe; Biesemans, Serge; Lu, Jiong-Ping; Wise, Rick; Machkaoutsan, Vladimir; Bauer, Matthias; Weeks, Dorian; Thomas, Shawn (2008)

Stress analysis of Si1-xGex embedded source/drain junctions

Bargallo Gonzalez, Mireia; Simoen, Eddy; Naka, N.; Okuno, Y; Eneman, Geert; Hikavyy, Andriy; Verheyen, Peter; Loo, Roger; Claeys, Cor; Machkaoutsan, Vladimir; Tomasini, Pierre; Thomas, S.G.; Lu, J.P; Wise, Rick (2008)