Browsing by author "De Blauwe, Jan"
Now showing items 1-18 of 18
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A flash memory technology with quasi-virtual ground array for low-cost embedded applications
Tsouhlarakis, Jorgo; Vanhorebeek, Guido; Verhoeven, Geert; De Blauwe, Jan; Kim, Shi-Ho; Wellekens, Dirk; Hendrickx, Paul; Haspeslagh, Luc; Van Houdt, Jan; Maes, Herman (2001) -
A low voltage, high performance 0.35 μm embedded flash EEPROM cell technology
Wellekens, Dirk; Van Houdt, Jan; De Blauwe, Jan; Haspeslagh, Luc; Deferm, Ludo; Maes, Herman (1998) -
A new polarity dependence of the reduced trap generation during high-field degradation of nitrided oxides
Degraeve, Robin; De Blauwe, Jan; Ogier, Jean-Luc; Roussel, Philippe; Groeseneken, Guido; Maes, Herman (1996) -
A new quantitative model to predict SILC-related disturb characteristics in Flash E2PROM devices
De Blauwe, Jan; Van Houdt, Jan; Wellekens, Dirk; Degraeve, Robin; Roussel, Philippe; Haspeslagh, Luc; Deferm, Ludo; Groeseneken, Guido; Maes, Herman (1996) -
Assessment of oxide reliability and hot carrier degradation in CMOS technology
Maes, Herman; Groeseneken, Guido; Degraeve, Robin; De Blauwe, Jan; Van den Bosch, Geert (1998) -
Degradation and nitridation dependence of steady-state stress induced leakage current (SILC)
De Blauwe, Jan; Degraeve, Robin; Bellens, Rudi; Van Houdt, Jan; Groeseneken, Guido; Maes, Herman (1996) -
High-temperature reliability behavior of SSI-flash EEPROM devices
De Blauwe, Jan; Wellekens, Dirk; Groeseneken, Guido; Haspeslagh, Luc; Van Houdt, Jan; Deferm, Ludo; Maes, Herman (1997) -
Impact of tunnel-oxide nitridation on endurance and read-disturb characteristics of flash E2PROM devices
De Blauwe, Jan; Wellekens, Dirk; Van Houdt, Jan; Degraeve, Robin; Haspeslagh, Luc; Groeseneken, Guido; Maes, Herman (1997) -
On the breakdown statistics and mechanisms in ultra-thin oxides and nitrided oxides
Groeseneken, Guido; Degraeve, Robin; De Blauwe, Jan; Roussel, Philippe; Depas, Michel; Maes, Herman (1997) -
Read-disturb and endurance of SSI-flash E2PROM devices at high operating temperatures
De Blauwe, Jan; Wellekens, Dirk; Groeseneken, Guido; Haspeslagh, Luc; Van Houdt, Jan; Deferm, Ludo; Maes, Herman (1998) -
Reliability of ultra-thin dielectrics for giga scale silicon technologies
Maes, Herman; Degraeve, Robin; Nigam, Tanya; De Blauwe, Jan; Groeseneken, Guido (1998) -
Reliability of ultra-thin dielectrics for giga scale silicon technologies
Maes, Herman; Degraeve, Robin; Nigam, Tanya; De Blauwe, Jan; Groeseneken, Guido (1999) -
Reliable 5.9nm tunnel oxide flash EEPROM device
De Blauwe, Jan; Van Houdt, Jan; Wellekens, Dirk; Haspeslagh, Luc; Groeseneken, Guido; Maes, Herman (1997) -
SILC-related effects in flash E2PROM's - Part I: A quantitative model for steady-state SILC
De Blauwe, Jan; Van Houdt, Jan; Wellekens, Dirk; Groeseneken, Guido; Maes, Herman (1998) -
SILC-related effects in flash E2PROM's - Part II: Prediction of steady-state SILC-related disturb characteristics
De Blauwe, Jan; Van Houdt, Jan; Wellekens, Dirk; Groeseneken, Guido; Maes, Herman (1998) -
Stress induced leakage current in thin oxides and its impact on flash memory reliability
De Blauwe, Jan (1998-05) -
Study of DC stress induced leakage current (SILC) and its dependence on oxide nitridation
De Blauwe, Jan; Degraeve, Robin; Bellens, Rudi; Van Houdt, Jan; Roussel, Philippe; Groeseneken, Guido; Maes, Herman (1996) -
Subthreshold source-side injection (S3I): a promising programming mechanism for scaled-down, low-power Flash memories
Van Houdt, Jan; De Blauwe, Jan; Wellekens, Dirk; Haspeslagh, Luc; Deferm, Ludo; Groeseneken, Guido; Maes, Herman (1996)