Browsing by author "Goes, W."
Now showing items 1-11 of 11
-
A rigorous study of measurement techniques for negative bias temperature instability
Grasser, T.; Wagner, P. J.; Hehenberger, P.; Goes, W.; Kaczer, Ben (2008-09) -
Characterization and modeling of charge trapping: From single defects to devices
Grasser, T.; Rzepa, G.; Waltl, M.; Goes, W.; Rott, K.; Rott, G.; Reisinger, H.; Franco, Jacopo; Kaczer, Ben (2014) -
Critical modeling issues in negative bias temperature instability
Grasser, Tibor; Goes, W.; Kaczer, Ben (2009-05) -
Defect creation stimulated by thermally activated hole trapping as the driving force behind negative bias temperature instability in SiO2, SiON, and high-k gate stacks
Grasser, T.; Kaczer, Ben; Aichinger, T.; Goes, W.; Nelhiebel, M. (2008) -
Direct tunneling and gate current fluctuations
Baumgartner, O.; Bina, M.; Goes, W.; Schanovsky, F.; Toledano Luque, Maria; Kaczer, Ben; Kosina, H.; Grasser, Tibor (2013) -
Hydrogen-related volatile defects as the possible cause for the recoverable component of NBTI
Grasser, T.; Rott, K.; Reisinger, H.; Waltl, M.; Wagner, P.; Schanovsky, F.; Goes, W.; Pobegen, G.; Kaczer, Ben (2013) -
On the impact of mechanical stress on gate oxide trapping
Goes, W.; Grasser, T.; Kruv, Anastasiia; Kaczer, Ben; Grill, Alexander; Gonzalez, Mario; Franco, Jacopo; Linten, Dimitri; De Wolf, Ingrid (2020) -
Physical modeling of NBTI: from individual defects to devices
Rzepa, G.; Goes, W.; Rott, G.; Rott, K.; Karner, M.; Kernstock, C.; Kaczer, Ben; Reisinger, H.; Grasser, T. (2014) -
The "permanent" component of NBTI revisited: saturation, degradation-reversal, and annealing
Grasser, T.; Waltl, M.; Rzepa, G.; Goes, W.; Wimmer, Y.; El-Sayed, A.-M.; Shluger, A. L.; Reisinger, H.; Kaczer, Ben (2016) -
Understanding correlated drain and gate current fluctuations
Goes, W.; Toledano Luque, Maria; Baumgartner, O.; Bina, M.; Schanovsky, F.; Kaczer, Ben; Grasser, T. (2013) -
Understanding negative bias temperature instability in the context of hole trapping
Grasser, T.; Kaczer, Ben; Goes, W.; Aichinger, T.; Hehenberger, P.; Nelhiebel, M. (2009)