Browsing by author "Fiegna, C."
Now showing items 1-10 of 10
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Failure mode for p-GaN gates under forward gate stress with varying Mg concentration
Stoffels, Steve; Bakeroot, Benoit; Wu, Tian-Li; Marcon, Denis; Posthuma, Niels; Decoutere, Stefaan; Tallarico, A.N.; Fiegna, C. (2017) -
Gate Reliability of p-GaN Power HEMTs Under Pulsed Stress Condition
Millesimo, M.; Bakeroot, Benoit; Borga, Matteo; Posthuma, Niels; Decoutere, Stefaan; Sangiorgi, E.; Fiegna, C.; Tallarico, A. N. (2022) -
High-Temperature Time-Dependent Gate Breakdown of p-GaN HEMTs
Millesimo, M.; Fiegna, C.; Tallarico, A. N.; Posthuma, Niels; Borga, Matteo; Bakeroot, Benoit; Decoutere, Stefaan (2021) -
Reduced self-heating by strained silicon substrate engineering
O'Neill, Anthony; Agaiby, Rimoon; Olsen, Sarah; Yang, Y.; Hellstrom, P.-E.; Ostling, M.; Oehme, M.; Lyutovich, K.; Kasper, E.; Eneman, Geert; Verheyen, Peter; Loo, Roger; Claeys, Cor; Fiegna, C.; Sangiorgi, E. (2008) -
Reduced self-heating by strained silicon substrate engineering
O'Neill, A.; Olsen, S.; Yang, Y.; Agaiby, R.; Hellstrom, P.E.; Ostling, M.; Lyutovich, K.; Kasper, E.; Eneman, Geert; Verheyen, Peter; Loo, Roger; Claeys, Cor; Fiegna, C.; Sangiorgio, E. (2007) -
Reduced self-heating by strained silicon substrate engineering
O'Neill, A.; Olsen, S.; Yang, Y.; Agaiby, R.; Hellstrom, P.E; Ostling, M.; Lyutovich, K.; Kasper, E.; Eneman, Geert; Verheyen, Peter; Loo, Roger; Claeys, Cor; Fiegna, C.; Sangiorgi, E. (2007) -
Reliability of Au-free AlGaN/GaN-on-silicon Schottky barrier diodes under ON-state stress
Tallarico, Andrea N.; Stoffels, Steve; Magnone, P.; Hu, Jie; Lenci, Silvia; Marcon, Denis; Sangiorgi, E.; Fiegna, C.; Decoutere, Stefaan (2016) -
Role of the GaN-on-Si Epi-Stack on ?R-ON Caused by Back-Gating Stress
Millesimo, M.; Borga, Matteo; Valentini, L.; Bakeroot, B.; Posthuma, Niels; Vohra, Anurag; Decoutere, Stefaan; Fiegna, C.; Tallarico, A. N. (2023) -
TCAD Modeling of the Dynamic VTH Hysteresis Under Fast Sweeping Characterization in p-GaN Gate HEMTs
Tallarico, A. N.; Millesimo, M.; Bakeroot, Benoit; Borga, Matteo; Posthuma, Niels; Decoutere, Stefaan; Sangiorgi, E.; Fiegna, C. (2022) -
The Role of Frequency and Duty Cycle on the Gate Reliability of p-GaN HEMTs
Millesimo, M.; Borga, Matteo; Bakeroot, Benoit; Posthuma, Niels; Decoutere, Stefaan; Sangiorgi, E.; Fiegna, C.; Tallarico, A. N. (2022)