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Role of the GaN-on-Si Epi-Stack on ?R-ON Caused by Back-Gating Stress
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Authors
Millesimo, M.
;
Borga, Matteo
;
Valentini, L.
;
Bakeroot, B.
;
Posthuma, Niels
;
Vohra, Anurag
;
Decoutere, Stefaan
;
Fiegna, C.
;
Tallarico, A. N.
DOI
10.1109/TED.2023.3304272
ISSN
0018-9383
Issue
10
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume
70
Title
Role of the GaN-on-Si Epi-Stack on ?R-ON Caused by Back-Gating Stress
Publication type
Journal article
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2
20.500.12860/42584.2
*
2023-12-07T11:10:13Z
validation by library/open access desk
1
20.500.12860/42584
2023-09-23T18:03:45Z
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